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Evaluation of critical thickness of GaP0.98N0.02 layer on GaP substrate by synchrotron X-ray diffraction topography

  • Henri Jussila
  • , Nagarajan Subramaniyam
  • , Sakari Sintonen
  • , Sami Suihkonen
  • , Aapo Lankinen
  • , Teppo Huhtio
  • , Carsten Paulmann
  • , Harri Lipsanen
  • , Turkka Tuomi
  • , Markku Sopanen
  • Aalto University
  • University of Hamburg

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)680-684
Number of pages5
JournalThin Solid Films
Volume534
DOIs
Publication statusPublished - 1 May 2013
MoE publication typeA1 Journal article-refereed

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