Evaluation of long-term stability of HVDC measuring system based on bandgap references

A. Merev, J. Hällström

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

The high-voltage DC measuring system based on bandgap voltage references has been used for high accuracy with low dynamic resistance up to 20 kV. The measuring system is stable output over a wide range of operating current and ambient temperature, and it is insensitive to effects due to leakage currents. One of the most important parameters of a reference system is its long-term stability. This paper describes the long-term performance of a high-voltage DC reference measuring system based on bandgap voltage references.

Original languageEnglish
Title of host publication29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages376-377
Number of pages2
ISBN (Electronic)978-1-4799-2479-0
ISBN (Print)978-1-4799-5205-2
DOIs
Publication statusPublished - 12 Sep 2014
MoE publication typeA4 Article in a conference publication
Event29th Conference on Precision Electromagnetic Measurements, CPEM 2014 - Rio de Janeiro, Brazil
Duration: 24 Aug 201429 Aug 2014

Publication series

SeriesCPEM Digest (Conference on Precision Electromagnetic Measurements)
ISSN0589-1485

Conference

Conference29th Conference on Precision Electromagnetic Measurements, CPEM 2014
CountryBrazil
CityRio de Janeiro
Period24/08/1429/08/14

Keywords

  • High-voltage techniques
  • measurement standards
  • measurement techniques
  • measurement uncertainty
  • precision measurements

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