Evaluation of the silica-on-silicon optical waveguide quality using scattering method

Päivi Heimala, Peter Råback, Jaakko Aarnio

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the XXVII Annual Conference of the Finnish Physical Society
    EditorsT. Kuusela
    Place of PublicationTurku
    PublisherUniversity of Turku
    ISBN (Print)978-951-880-938-1
    Publication statusPublished - 1993
    MoE publication typeA4 Article in a conference publication
    EventXXVII Annual Conference of the Finnish Physical Society - Turku, Finland
    Duration: 18 Mar 199320 Mar 1993

    Publication series

    SeriesUniversity of Turku: Department of Applied Physics. Report
    NumberR5
    ISSN0789-1822

    Conference

    ConferenceXXVII Annual Conference of the Finnish Physical Society
    CountryFinland
    CityTurku
    Period18/03/9320/03/93

    Cite this

    Heimala, P., Råback, P., & Aarnio, J. (1993). Evaluation of the silica-on-silicon optical waveguide quality using scattering method. In T. Kuusela (Ed.), Proceedings of the XXVII Annual Conference of the Finnish Physical Society [21.4] University of Turku. University of Turku: Department of Applied Physics. Report, No. R5