Evaluation of the silica-on-silicon optical waveguide quality using scattering method

Päivi Heimala; Peter Råback; Jaakko Aarnio

Evaluation of the silica-on-silicon optical waveguide quality using scattering method

Päivi Heimala, Peter Råback, Jaakko Aarnio

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of the XXVII Annual Conference of the Finnish Physical Society
Editors	T. Kuusela
Place of Publication	Turku
Publisher	University of Turku
ISBN (Print)	978-951-880-938-1
Publication status	Published - 1993
MoE publication type	A4 Article in a conference publication
Event	XXVII Annual Conference of the Finnish Physical Society - Turku, Finland Duration: 18 Mar 1993 → 20 Mar 1993

Publication series

Series	University of Turku: Department of Applied Physics. Report
Number	R5
ISSN	0789-1822

Conference

Conference	XXVII Annual Conference of the Finnish Physical Society
Country/Territory	Finland
City	Turku
Period	18/03/93 → 20/03/93

Cite this

@inproceedings{d836e92c450e4d9186e5d8ca548d8269,

title = "Evaluation of the silica-on-silicon optical waveguide quality using scattering method",

author = "P{\"a}ivi Heimala and Peter R{\aa}back and Jaakko Aarnio",

note = "Project code: PUO2014; XXVII Annual Conference of the Finnish Physical Society ; Conference date: 18-03-1993 Through 20-03-1993",

year = "1993",

language = "English",

isbn = "978-951-880-938-1",

series = "University of Turku: Department of Applied Physics. Report",

publisher = "University of Turku",

number = "R5",

editor = "T. Kuusela",

booktitle = "Proceedings of the XXVII Annual Conference of the Finnish Physical Society",

address = "Finland",

}

Heimala, P, Råback, P & Aarnio, J 1993, Evaluation of the silica-on-silicon optical waveguide quality using scattering method. in T Kuusela (ed.), Proceedings of the XXVII Annual Conference of the Finnish Physical Society., 21.4, University of Turku, Turku, University of Turku: Department of Applied Physics. Report, no. R5, XXVII Annual Conference of the Finnish Physical Society, Turku, Finland, 18/03/93.

Evaluation of the silica-on-silicon optical waveguide quality using scattering method. / Heimala, Päivi; Råback, Peter; Aarnio, Jaakko.
Proceedings of the XXVII Annual Conference of the Finnish Physical Society. ed. / T. Kuusela. Turku: University of Turku, 1993. 21.4 (University of Turku: Department of Applied Physics. Report; No. R5).

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Evaluation of the silica-on-silicon optical waveguide quality using scattering method

AU - Heimala, Päivi

AU - Råback, Peter

AU - Aarnio, Jaakko

N1 - Project code: PUO2014

PY - 1993

Y1 - 1993

M3 - Conference article in proceedings

SN - 978-951-880-938-1

T3 - University of Turku: Department of Applied Physics. Report

BT - Proceedings of the XXVII Annual Conference of the Finnish Physical Society

A2 - Kuusela, T.

PB - University of Turku

CY - Turku

T2 - XXVII Annual Conference of the Finnish Physical Society

Y2 - 18 March 1993 through 20 March 1993

ER -