Experiences of Laboratory and Field Demonstrations of Distribution Network Congestion Management

Anna Kulmala, Andrea Angioni, Sami Repo, Davide Della Giustina, Antimo Barbato, Ferdinanda Ponci

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Abstract

    This paper presents experiences of laboratory testing and field demonstration of a distribution network congestion management algorithm. Development process for new smart grid functionalities and automation architectures is discussed both in general level and through the example case of congestion management. The practical implementation of the developed algorithm is explained and test setups in all development process steps (offline simulations, laboratory testing and field demonstration) are presented. The objectives in different stages of the algorithm development and testing process are discussed and lessons learned from all the steps are represented.
    Original languageEnglish
    Title of host publication IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages3543-3549
    Number of pages7
    ISBN (Electronic)978-1-5090-6684-1, 978-1-5090-6683-4
    ISBN (Print)978-1-5090-6685-8
    DOIs
    Publication statusPublished - 2018
    MoE publication typeNot Eligible
    Event44th Annual Conference of the IEEE Industrial Electronics Society, IECON 2018 - Washinton, United States
    Duration: 21 Oct 201823 Oct 2018

    Conference

    Conference44th Annual Conference of the IEEE Industrial Electronics Society, IECON 2018
    Abbreviated titleIECON
    CountryUnited States
    CityWashinton
    Period21/10/1823/10/18

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    Cite this

    Kulmala, A., Angioni, A., Repo, S., Della Giustina, D., Barbato, A., & Ponci, F. (2018). Experiences of Laboratory and Field Demonstrations of Distribution Network Congestion Management. In IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society (pp. 3543-3549). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/IECON.2018.8591412