Experimental analysis of Ag+‐Na+ exchange in glass with Ag film ion sources for planar optical waveguide fabrication

Seppo Honkanen, Ari Tervonen

Research output: Contribution to journalArticleScientificpeer-review

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Abstract

A detailed experimental analysis of Ag+‐Na+ ion exchange in glass using Ag films as ion sources for the fabrication of planar optical waveguides has been performed.
The refractive index profiles of the waveguides have been measured and compared to the theoretical Ag+ concentration profiles.
The theoretically predicted special characteristics of the process are verified and the material parameters of the used substrate glass (Corning 0211) are evaluated.
Original languageEnglish
Pages (from-to)634-635
JournalJournal of Applied Physics
Volume63
Issue number3
DOIs
Publication statusPublished - 1988
MoE publication typeA1 Journal article-refereed

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optical waveguides
ion sources
fabrication
glass
profiles
refractivity
waveguides
ions

Cite this

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title = "Experimental analysis of Ag+‐Na+ exchange in glass with Ag film ion sources for planar optical waveguide fabrication",
abstract = "A detailed experimental analysis of Ag+‐Na+ ion exchange in glass using Ag films as ion sources for the fabrication of planar optical waveguides has been performed. The refractive index profiles of the waveguides have been measured and compared to the theoretical Ag+ concentration profiles. The theoretically predicted special characteristics of the process are verified and the material parameters of the used substrate glass (Corning 0211) are evaluated.",
author = "Seppo Honkanen and Ari Tervonen",
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language = "English",
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journal = "Journal of Applied Physics",
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Experimental analysis of Ag+‐Na+ exchange in glass with Ag film ion sources for planar optical waveguide fabrication. / Honkanen, Seppo; Tervonen, Ari.

In: Journal of Applied Physics, Vol. 63, No. 3, 1988, p. 634-635.

Research output: Contribution to journalArticleScientificpeer-review

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AU - Tervonen, Ari

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AB - A detailed experimental analysis of Ag+‐Na+ ion exchange in glass using Ag films as ion sources for the fabrication of planar optical waveguides has been performed. The refractive index profiles of the waveguides have been measured and compared to the theoretical Ag+ concentration profiles. The theoretically predicted special characteristics of the process are verified and the material parameters of the used substrate glass (Corning 0211) are evaluated.

U2 - 10.1063/1.340103

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