Abstract
Publisher Summary
This chapter presents a study on the performance of three different kinds of passive resistor-transmission line discharge probes—an unshielded ball probe developed at Physikalish-Technische Bundesansalt (PTB-probe), a shielded ball probe having an earthed hemispherical shield with the electrostatic discharge (ESD) current collected on a coaxial wire tip and developed at Electrostatics Solutions Ltd. (ESL-probe), and a needle-like shielded probe developed at SP Swedish National Research and Testing Institute (SP-probe). Different kinds of probes have been developed during the past years for the measurement of air discharges—spark and brash discharges—to evaluate the ESD risks without the use of explosive atmospheres or destructive tests of electronics. The chapter evaluates their possible application in assessment of ignition hazards or ESD damage risks to electronic components. The results show that there is no single probe type that is ideal for all kinds of situations. There are significant differences among the probe responses in their ability to initiate ESD, charge transferred, and peak ESD current.
This chapter presents a study on the performance of three different kinds of passive resistor-transmission line discharge probes—an unshielded ball probe developed at Physikalish-Technische Bundesansalt (PTB-probe), a shielded ball probe having an earthed hemispherical shield with the electrostatic discharge (ESD) current collected on a coaxial wire tip and developed at Electrostatics Solutions Ltd. (ESL-probe), and a needle-like shielded probe developed at SP Swedish National Research and Testing Institute (SP-probe). Different kinds of probes have been developed during the past years for the measurement of air discharges—spark and brash discharges—to evaluate the ESD risks without the use of explosive atmospheres or destructive tests of electronics. The chapter evaluates their possible application in assessment of ignition hazards or ESD damage risks to electronic components. The results show that there is no single probe type that is ideal for all kinds of situations. There are significant differences among the probe responses in their ability to initiate ESD, charge transferred, and peak ESD current.
Original language | English |
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Title of host publication | Recent Developments in Applied Electrostatics |
Subtitle of host publication | Proceedings of the Fifth International Conference on Applied Electrostatics |
Publisher | Elsevier |
Pages | 318-321 |
ISBN (Print) | 0-08-044584-5, 978-0-08-044584-7 |
DOIs | |
Publication status | Published - 2004 |
MoE publication type | A4 Article in a conference publication |
Event | 5th International Conference on Applied Electrostatics, ICAES 2004 - Shanghai, China Duration: 2 Nov 2004 → 5 Nov 2004 Conference number: 5 |
Conference
Conference | 5th International Conference on Applied Electrostatics, ICAES 2004 |
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Abbreviated title | ICAES 2004 |
Country/Territory | China |
City | Shanghai |
Period | 2/11/04 → 5/11/04 |