Experimental evaluation of CCD and CMOS cameras in low-light-level conditions

Jyrki Laitinen, Heikki Ailisto

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

Original languageEnglish
Title of host publicationDiagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999
Place of PublicationBellingham
PublisherInternational Society for Optics and Photonics SPIE
Pages60 - 65
ISBN (Print)0-8194-3313-6
Publication statusPublished - 1999
MoE publication typeB3 Non-refereed article in conference proceedings

Publication series

NameProceedings of SPIE
Volume3827

Keywords

  • CCD
  • CMOS
  • low light level
  • surveillance
  • UMTS

Cite this

Laitinen, J., & Ailisto, H. (1999). Experimental evaluation of CCD and CMOS cameras in low-light-level conditions. In Diagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999 (pp. 60 - 65). Bellingham: International Society for Optics and Photonics SPIE. Proceedings of SPIE, Vol.. 3827
Laitinen, Jyrki ; Ailisto, Heikki. / Experimental evaluation of CCD and CMOS cameras in low-light-level conditions. Diagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999. Bellingham : International Society for Optics and Photonics SPIE, 1999. pp. 60 - 65 (Proceedings of SPIE, Vol. 3827).
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Laitinen, J & Ailisto, H 1999, Experimental evaluation of CCD and CMOS cameras in low-light-level conditions. in Diagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999. International Society for Optics and Photonics SPIE, Bellingham, Proceedings of SPIE, vol. 3827, pp. 60 - 65.

Experimental evaluation of CCD and CMOS cameras in low-light-level conditions. / Laitinen, Jyrki; Ailisto, Heikki.

Diagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999. Bellingham : International Society for Optics and Photonics SPIE, 1999. p. 60 - 65 (Proceedings of SPIE, Vol. 3827).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

TY - GEN

T1 - Experimental evaluation of CCD and CMOS cameras in low-light-level conditions

AU - Laitinen, Jyrki

AU - Ailisto, Heikki

N1 - ELE

PY - 1999

Y1 - 1999

KW - CCD

KW - CMOS

KW - low light level

KW - surveillance

KW - UMTS

M3 - Conference article in proceedings

SN - 0-8194-3313-6

T3 - Proceedings of SPIE

SP - 60

EP - 65

BT - Diagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999

PB - International Society for Optics and Photonics SPIE

CY - Bellingham

ER -

Laitinen J, Ailisto H. Experimental evaluation of CCD and CMOS cameras in low-light-level conditions. In Diagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999. Bellingham: International Society for Optics and Photonics SPIE. 1999. p. 60 - 65. (Proceedings of SPIE, Vol. 3827).