Experimental evaluation of CCD and CMOS cameras in low-light-level conditions

Jyrki Laitinen, Heikki Ailisto

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

3 Citations (Scopus)
Original languageEnglish
Title of host publicationDiagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999
Place of PublicationBellingham
PublisherInternational Society for Optics and Photonics SPIE
Pages60 - 65
ISBN (Print)0-8194-3313-6
Publication statusPublished - 1999
MoE publication typeB3 Non-refereed article in conference proceedings

Publication series

SeriesProceedings of SPIE


  • CCD
  • CMOS
  • low light level
  • surveillance
  • UMTS

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