Experimental evaluation of CCD and CMOS cameras in low-light-level conditions

Jyrki Laitinen, Heikki Ailisto

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    3 Citations (Scopus)
    Original languageEnglish
    Title of host publicationDiagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999
    Place of PublicationBellingham
    PublisherInternational Society for Optics and Photonics SPIE
    Pages60 - 65
    ISBN (Print)0-8194-3313-6
    Publication statusPublished - 1999
    MoE publication typeB3 Non-refereed article in conference proceedings

    Publication series

    SeriesProceedings of SPIE


    • CCD
    • CMOS
    • low light level
    • surveillance
    • UMTS

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