Experimental evaluation of CCD and CMOS cameras in low-light-level conditions

Jyrki Laitinen; Heikki Ailisto

Experimental evaluation of CCD and CMOS cameras in low-light-level conditions

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

Original language	English
Title of host publication	Diagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999
Place of Publication	Bellingham
Publisher	International Society for Optics and Photonics SPIE
Pages	60 - 65
ISBN (Print)	0-8194-3313-6
Publication status	Published - 1999
MoE publication type	B3 Non-refereed article in conference proceedings

Publication series

Series	Proceedings of SPIE
Volume	3827

Keywords

CCD
CMOS
low light level
surveillance
UMTS

Cite this

@inproceedings{cda2615ab9414aeda1890aa2fbcada0d,

title = "Experimental evaluation of CCD and CMOS cameras in low-light-level conditions",

keywords = "CCD, CMOS, low light level, surveillance, UMTS",

author = "Jyrki Laitinen and Heikki Ailisto",

note = "ELE",

year = "1999",

language = "English",

isbn = "0-8194-3313-6",

series = "Proceedings of SPIE",

publisher = "International Society for Optics and Photonics SPIE",

pages = "60 -- 65",

booktitle = "Diagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999",

address = "United States",

}

Experimental evaluation of CCD and CMOS cameras in low-light-level conditions. / Laitinen, Jyrki; Ailisto, Heikki.

Diagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999. Bellingham : International Society for Optics and Photonics SPIE, 1999. p. 60 - 65 (Proceedings of SPIE, Vol. 3827).

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

TY - GEN

T1 - Experimental evaluation of CCD and CMOS cameras in low-light-level conditions

AU - Laitinen, Jyrki

AU - Ailisto, Heikki

N1 - ELE

PY - 1999

Y1 - 1999

KW - CCD

KW - CMOS

KW - low light level

KW - surveillance

KW - UMTS

M3 - Conference article in proceedings

SN - 0-8194-3313-6

T3 - Proceedings of SPIE

SP - 60

EP - 65

BT - Diagnostic Imaging Technologies and Industrial Applications. Munich, De, 14 - 15 June 1999

PB - International Society for Optics and Photonics SPIE

CY - Bellingham

ER -