Abstract
Adjustment of the charge carrier density in quantized Hall resistance (QHR) devices based on epitaxial SiC graphene films can be performed using photochemical and chemical gating. Our experiments show that the carrier concentration in fabricated graphene devices can be reversibly varied by either treatment with UV light or using molecules from aqua ammonia. Treatment of SiC graphene QHR devices in such a way provides tuning of carrier concentration to optimum values, in the range (1-3) x 1011 cm-2, at which the dissipation in QHR regime is reduced and the full quantization of Hall resistance is expected.
Original language | English |
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Title of host publication | 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Number of pages | 2 |
ISBN (Electronic) | 978-1-4673-9132-0, 978-1-4673-9134-4 |
ISBN (Print) | 978-1-4673-9135-1 |
DOIs | |
Publication status | Published - 11 Aug 2016 |
MoE publication type | A4 Article in a conference publication |
Event | Conference on Precision Electromagnetic Measurements, CPEM 2016 - Ottawa, Canada Duration: 10 Jul 2016 → 15 Jul 2016 |
Conference
Conference | Conference on Precision Electromagnetic Measurements, CPEM 2016 |
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Abbreviated title | CPEM 2016 |
Country/Territory | Canada |
City | Ottawa |
Period | 10/07/16 → 15/07/16 |
Keywords
- carrier concentration
- chemical functionalization
- Epitaxial graphene
- graphene fabrication
- precision measurement