Experimental study of Evanohm thin film resistors at subkelvin temperatures

A.F. Satrapinski, A.M. Savin, S. Novikov, Ossi Hahtela

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)

Abstract

Thin film resistors, based on the Evanohm (Ni75%Cr20%Cu2.5%Al2.5%) alloy, have been investigated at cryogenic temperatures. The objective of the study is the development of the high value resistor for precision electrical measurements at low temperature and particularly for metrological triangle experiments. Thin film resistors of different configurations have been designed and fabricated by the thermal evaporation process. The resistivity of investigated resistors is 110 × 10−8 Ω m; the resistance exhibits a Kondo minimum at a temperature near 30 K and increases with further reduction of temperature. In the temperature range 50–65 mK, the temperature coefficient reaches −20 × 10−3 K−1. Power dependence measurements at subkelvin temperatures demonstrate that noticeable electron overheating takes place only at the power level above 10 pW for a 500 kΩ resistor. The electron–phonon coupling constant for the fabricated Evanohm thin films has been derived from experimental results.
Original languageEnglish
Number of pages5
JournalMeasurement Science and Technology
Volume19
Issue number5
DOIs
Publication statusPublished - 2008
MoE publication typeA1 Journal article-refereed

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resistors
Resistors
Thin Films
Experimental Study
Thin films
thin films
Temperature
temperature
cryogenic temperature
triangles
electrical measurement
Resistivity
Evaporation
Thermal evaporation
evaporation
Triangle
Cryogenics
electrical resistivity
Electron
coefficients

Cite this

Satrapinski, A.F. ; Savin, A.M. ; Novikov, S. ; Hahtela, Ossi. / Experimental study of Evanohm thin film resistors at subkelvin temperatures. In: Measurement Science and Technology. 2008 ; Vol. 19, No. 5.
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Experimental study of Evanohm thin film resistors at subkelvin temperatures. / Satrapinski, A.F.; Savin, A.M.; Novikov, S.; Hahtela, Ossi.

In: Measurement Science and Technology, Vol. 19, No. 5, 2008.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Experimental study of Evanohm thin film resistors at subkelvin temperatures

AU - Satrapinski, A.F.

AU - Savin, A.M.

AU - Novikov, S.

AU - Hahtela, Ossi

PY - 2008

Y1 - 2008

N2 - Thin film resistors, based on the Evanohm (Ni75%Cr20%Cu2.5%Al2.5%) alloy, have been investigated at cryogenic temperatures. The objective of the study is the development of the high value resistor for precision electrical measurements at low temperature and particularly for metrological triangle experiments. Thin film resistors of different configurations have been designed and fabricated by the thermal evaporation process. The resistivity of investigated resistors is 110 × 10−8 Ω m; the resistance exhibits a Kondo minimum at a temperature near 30 K and increases with further reduction of temperature. In the temperature range 50–65 mK, the temperature coefficient reaches −20 × 10−3 K−1. Power dependence measurements at subkelvin temperatures demonstrate that noticeable electron overheating takes place only at the power level above 10 pW for a 500 kΩ resistor. The electron–phonon coupling constant for the fabricated Evanohm thin films has been derived from experimental results.

AB - Thin film resistors, based on the Evanohm (Ni75%Cr20%Cu2.5%Al2.5%) alloy, have been investigated at cryogenic temperatures. The objective of the study is the development of the high value resistor for precision electrical measurements at low temperature and particularly for metrological triangle experiments. Thin film resistors of different configurations have been designed and fabricated by the thermal evaporation process. The resistivity of investigated resistors is 110 × 10−8 Ω m; the resistance exhibits a Kondo minimum at a temperature near 30 K and increases with further reduction of temperature. In the temperature range 50–65 mK, the temperature coefficient reaches −20 × 10−3 K−1. Power dependence measurements at subkelvin temperatures demonstrate that noticeable electron overheating takes place only at the power level above 10 pW for a 500 kΩ resistor. The electron–phonon coupling constant for the fabricated Evanohm thin films has been derived from experimental results.

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