Exploring the fundamental conceptual units of technical emergence

Arho Suominen, Nils C. Newman

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    1 Citation (Scopus)

    Abstract

    The study of emerging technologies is broad and has multiple and often poorly integrated threads. For example, some literature draw from a number of characteristics such as radicalness, growth speed, coherence, impact, uncertainty and ambiguity while other only look at expected economic benefits. This fractured view of the growth of new technologies has created a hodgepodge of approaches and a dearth of fundamental measures within this research space. Recent efforts at developing a more fundamental measure of technological behavior have yielded "Technical Emergence" - a simple proposition which seeks to measure the growth of concepts within a community of users by tracking Novelty, Persistence, Community and Growth. This fundamental unit induces the possibility to actually measure and, more importantly test, its behavior using repeatable bibliometric techniques. We discuss in detail the conceptual origins and evaluate the concept of technological emergence and relations of indicators to it.

    Original languageEnglish
    Title of host publicationPICMET 2017 - Portland International Conference on Management of Engineering and Technology
    Subtitle of host publicationTechnology Management for the Interconnected World, Proceedings
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages1-5
    Number of pages5
    Volume2017-January
    ISBN (Electronic)9781890843366
    DOIs
    Publication statusPublished - 29 Nov 2017
    MoE publication typeA4 Article in a conference publication
    Event2017 Portland International Conference on Management of Engineering and Technology, PICMET 2017 - Portland, United States
    Duration: 9 Jul 201713 Jul 2017

    Conference

    Conference2017 Portland International Conference on Management of Engineering and Technology, PICMET 2017
    Abbreviated titlePICMET 2017
    CountryUnited States
    CityPortland
    Period9/07/1713/07/17

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  • Cite this

    Suominen, A., & Newman, N. C. (2017). Exploring the fundamental conceptual units of technical emergence. In PICMET 2017 - Portland International Conference on Management of Engineering and Technology: Technology Management for the Interconnected World, Proceedings (Vol. 2017-January, pp. 1-5). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.23919/PICMET.2017.8125287