Exploring the fundamental conceptual units of technical emergence

Arho Suominen, Nils C. Newman

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Abstract

The study of emerging technologies is broad and has multiple and often poorly integrated threads. For example, some literature draw from a number of characteristics such as radicalness, growth speed, coherence, impact, uncertainty and ambiguity while other only look at expected economic benefits. This fractured view of the growth of new technologies has created a hodgepodge of approaches and a dearth of fundamental measures within this research space. Recent efforts at developing a more fundamental measure of technological behavior have yielded "Technical Emergence" - a simple proposition which seeks to measure the growth of concepts within a community of users by tracking Novelty, Persistence, Community and Growth. This fundamental unit induces the possibility to actually measure and, more importantly test, its behavior using repeatable bibliometric techniques. We discuss in detail the conceptual origins and evaluate the concept of technological emergence and relations of indicators to it.

Original languageEnglish
Title of host publicationPICMET 2017 - Portland International Conference on Management of Engineering and Technology
Subtitle of host publicationTechnology Management for the Interconnected World, Proceedings
PublisherInstitute of Electrical and Electronic Engineers IEEE
Pages1-5
Number of pages5
Volume2017-January
ISBN (Electronic)9781890843366
DOIs
Publication statusPublished - 29 Nov 2017
MoE publication typeA4 Article in a conference publication
Event2017 Portland International Conference on Management of Engineering and Technology, PICMET 2017 - Portland, United States
Duration: 9 Jul 201713 Jul 2017

Conference

Conference2017 Portland International Conference on Management of Engineering and Technology, PICMET 2017
Abbreviated titlePICMET 2017
CountryUnited States
CityPortland
Period9/07/1713/07/17

Fingerprint

Space research
community
persistence
new technology
uncertainty
Economics
economics
coherence
literature
Uncertainty
Economic benefits
Persistence
Emerging technologies
Thread
Integrated
Novelty
Bibliometrics

Cite this

Suominen, A., & Newman, N. C. (2017). Exploring the fundamental conceptual units of technical emergence. In PICMET 2017 - Portland International Conference on Management of Engineering and Technology: Technology Management for the Interconnected World, Proceedings (Vol. 2017-January, pp. 1-5). Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.23919/PICMET.2017.8125287
Suominen, Arho ; Newman, Nils C. / Exploring the fundamental conceptual units of technical emergence. PICMET 2017 - Portland International Conference on Management of Engineering and Technology: Technology Management for the Interconnected World, Proceedings. Vol. 2017-January Institute of Electrical and Electronic Engineers IEEE, 2017. pp. 1-5
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Suominen, A & Newman, NC 2017, Exploring the fundamental conceptual units of technical emergence. in PICMET 2017 - Portland International Conference on Management of Engineering and Technology: Technology Management for the Interconnected World, Proceedings. vol. 2017-January, Institute of Electrical and Electronic Engineers IEEE, pp. 1-5, 2017 Portland International Conference on Management of Engineering and Technology, PICMET 2017, Portland, United States, 9/07/17. https://doi.org/10.23919/PICMET.2017.8125287

Exploring the fundamental conceptual units of technical emergence. / Suominen, Arho; Newman, Nils C.

PICMET 2017 - Portland International Conference on Management of Engineering and Technology: Technology Management for the Interconnected World, Proceedings. Vol. 2017-January Institute of Electrical and Electronic Engineers IEEE, 2017. p. 1-5.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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Suominen A, Newman NC. Exploring the fundamental conceptual units of technical emergence. In PICMET 2017 - Portland International Conference on Management of Engineering and Technology: Technology Management for the Interconnected World, Proceedings. Vol. 2017-January. Institute of Electrical and Electronic Engineers IEEE. 2017. p. 1-5 https://doi.org/10.23919/PICMET.2017.8125287