Exploring the sources of waste in Kanban software development projects

M. Ikonen, P. Kettunen, Nilay Oza, P. Abrahamsson

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

29 Citations (Scopus)

Abstract

The application of agile software methods and more recently the integration of Lean practices contribute to the trend of continuous improvement in the software industry. One such area warranting proper empirical evidence is a project's operational efficiency when using the Kanban method. This short paper takes a new angle and explores waste in the Kanban-driven software development project context. A preliminary research model is presented for helping the consequent replication of the study. The results from the empirical analysis suggest Kanban can be an effective method in visualizing and organizing the current work, but does not prevent waste from creeping in, although the overall project outcome may be successful. (18 refs.)
Original languageEnglish
Title of host publicationProceedings
Subtitle of host publication36th EUROMICRO Conference on Software Engineering and Advanced Applications, SEAA 2010
Place of PublicationLos Alamitos, CA, USA
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages376-381
ISBN (Print)978-1-4244-7901-6
DOIs
Publication statusPublished - 2010
MoE publication typeA4 Article in a conference publication
Event36th EUROMICRO Conference on Software Engineering and Advanced Applications, SEAA 2010 - Lille, France
Duration: 1 Sep 20103 Sep 2010

Conference

Conference36th EUROMICRO Conference on Software Engineering and Advanced Applications, SEAA 2010
Abbreviated titleSEAA 2010
CountryFrance
CityLille
Period1/09/103/09/10

    Fingerprint

Cite this

Ikonen, M., Kettunen, P., Oza, N., & Abrahamsson, P. (2010). Exploring the sources of waste in Kanban software development projects. In Proceedings: 36th EUROMICRO Conference on Software Engineering and Advanced Applications, SEAA 2010 (pp. 376-381). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/SEAA.2010.40