External-cavity diode laser based spectrometer for absolute determination of iodine lines around 633 nm

M. Vainio, M. Merimaa, K. Nyholm, E. Ikonen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

We have developed and characterized a new iodine spectrometer for absolute frequency measurements of I2 transitions at the 633-nm region. This region is important especially in length metrology. To obtain good frequency accuracy, the various sources of frequency shifts in the used saturation spectroscopy configuration have been minimized by optimizing the laser beams for spatial and spectral quality. This is done by injection locking a microlens-coupled diode laser with nearly Gaussian output beam to a stable external-cavity diode laser. The use of the injection-locking scheme also reduces the detrimental effects of optical feedback, as well as residual amplitude modulation related to laser frequency modulation via injection current.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherInternational Society for Optics and Photonics SPIE
Pages331-339
Number of pages9
Volume5826
DOIs
Publication statusPublished - 15 Nov 2005
MoE publication typeNot Eligible
EventOpto-Ireland 2005: Optical Sensing and Spectroscopy - Dublin, Ireland
Duration: 4 Apr 20056 Apr 2005

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherInternational Society for Optics and Photonics SPIE
ISSN (Print)0277-786X

Conference

ConferenceOpto-Ireland 2005: Optical Sensing and Spectroscopy
CountryIreland
CityDublin
Period4/04/056/04/05

Fingerprint

injection locking
Iodine
iodine
Semiconductor lasers
Spectrometers
semiconductor lasers
spectrometers
Optical feedback
cavities
Amplitude modulation
frequency measurement
Frequency modulation
frequency modulation
metrology
frequency shift
Laser beams
Spectroscopy
laser beams
injection
saturation

Keywords

  • External-cavity diode laser
  • Injection locking
  • Iodine
  • Optical frequency measurements
  • Spectroscopy

Cite this

Vainio, M., Merimaa, M., Nyholm, K., & Ikonen, E. (2005). External-cavity diode laser based spectrometer for absolute determination of iodine lines around 633 nm. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5826, pp. 331-339). [42] International Society for Optics and Photonics SPIE. Proceedings of SPIE https://doi.org/10.1117/12.605104
Vainio, M. ; Merimaa, M. ; Nyholm, K. ; Ikonen, E. / External-cavity diode laser based spectrometer for absolute determination of iodine lines around 633 nm. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5826 International Society for Optics and Photonics SPIE, 2005. pp. 331-339 (Proceedings of SPIE).
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Vainio, M, Merimaa, M, Nyholm, K & Ikonen, E 2005, External-cavity diode laser based spectrometer for absolute determination of iodine lines around 633 nm. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 5826, 42, International Society for Optics and Photonics SPIE, Proceedings of SPIE, pp. 331-339, Opto-Ireland 2005: Optical Sensing and Spectroscopy, Dublin, Ireland, 4/04/05. https://doi.org/10.1117/12.605104

External-cavity diode laser based spectrometer for absolute determination of iodine lines around 633 nm. / Vainio, M.; Merimaa, M.; Nyholm, K.; Ikonen, E.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5826 International Society for Optics and Photonics SPIE, 2005. p. 331-339 42 (Proceedings of SPIE).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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Vainio M, Merimaa M, Nyholm K, Ikonen E. External-cavity diode laser based spectrometer for absolute determination of iodine lines around 633 nm. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5826. International Society for Optics and Photonics SPIE. 2005. p. 331-339. 42. (Proceedings of SPIE). https://doi.org/10.1117/12.605104