Extremely short external cavity laser: profilometry via wavelength tuning

Janne Aikio, Dennis Howe

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

Original languageEnglish
Title of host publicationCLEO 2001 Technical Digest. Baltimore, US, 6 - 11 May 2001
Subtitle of host publicationSummaries of papers presented at the Conference on Lasers and Electro-Optics
Place of PublicationBaltimore
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages484 - 485
ISBN (Print)1-55752-662-1
DOIs
Publication statusPublished - 2001
MoE publication typeB3 Non-refereed article in conference proceedings

Cite this

Aikio, J., & Howe, D. (2001). Extremely short external cavity laser: profilometry via wavelength tuning. In CLEO 2001 Technical Digest. Baltimore, US, 6 - 11 May 2001: Summaries of papers presented at the Conference on Lasers and Electro-Optics (pp. 484 - 485). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/CLEO.2001.948074