Abstract
Several silicide compounds are promising materials for studies and applications of quantum phase slips (QPS) in superconducting nanowires (SNWs). This paper describes two nanofabrication processes, which were applied to manufacture silicide SNWs. Experiments on MoSi nanowires indicate size dependent crossover from conventional superconductivity to transport influenced by thermal and quantum fluctuations. Results of the first experiments on other silicide SNWs will be presented in the conference.
Original language | English |
---|---|
Title of host publication | CPEM 2018 - Conference on Precision Electromagnetic Measurements |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Number of pages | 2 |
ISBN (Electronic) | 978-1-5386-0974-3, 978-1-5386-0973-6 |
DOIs | |
Publication status | Published - 2018 |
MoE publication type | Not Eligible |
Event | Conference on Precision Electromagnetic Measurements, CPEM 2018 - Paris, France Duration: 8 Jul 2018 → 13 Jul 2018 |
Conference
Conference | Conference on Precision Electromagnetic Measurements, CPEM 2018 |
---|---|
Abbreviated title | CPEM |
Country/Territory | France |
City | Paris |
Period | 8/07/18 → 13/07/18 |
Keywords
- Nanolithography
- nanowires
- quantum phase slip
- silicides
- superconducting thin films
- OtaNano