Feasibility of using Charpy-size specimens in J-R curve testing

Kim Wallin, Timo Saario

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    Original languageEnglish
    Title of host publicationPrimary Circuit Integrity Meeting
    Subtitle of host publicationCSNI Principal Working Group No. 3
    Publication statusPublished - 1988
    MoE publication typeB3 Non-refereed article in conference proceedings

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