| Original language | English |
|---|---|
| Title of host publication | Primary Circuit Integrity Meeting |
| Subtitle of host publication | CSNI Principal Working Group No. 3 |
| Pages | 105-111 |
| Publication status | Published - 1988 |
| MoE publication type | B3 Non-refereed article in conference proceedings |
Feasibility of using Charpy-size specimens in J-R curve testing
Kim Wallin, Timo Saario
Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific