Feasibility of using Charpy-size specimens in J-R curve testing

Kim Wallin, Timo Saario

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    Original languageEnglish
    Title of host publicationPrimary Circuit Integrity Meeting
    Subtitle of host publicationCSNI Principal Working Group No. 3
    Pages105-111
    Publication statusPublished - 1988
    MoE publication typeB3 Non-refereed article in conference proceedings

    Cite this

    Wallin, K., & Saario, T. (1988). Feasibility of using Charpy-size specimens in J-R curve testing. In Primary Circuit Integrity Meeting: CSNI Principal Working Group No. 3 (pp. 105-111)