Feasibility of using Charpy-size specimens in J-R curve testing

Kim Wallin, Timo Saario

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

Original language	English
Title of host publication	Primary Circuit Integrity Meeting
Subtitle of host publication	CSNI Principal Working Group No. 3
Pages	105-111
Publication status	Published - 1988
MoE publication type	B3 Non-refereed article in conference proceedings

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