Finding preimages of multiple passwords secured with VSH

Kimmo Halunen, Pauli Rikula, Juha Röning

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Abstract

In this paper we present an improvement to the preimage attacks on Very Smooth Hash (VSH) function. VSH was proposed as a collision resistant hash function by Contini et al., but it has been found lacking in preimage resistance by Saarinen. With our method, we show how to find preimages of multiple passwords secured by VSH. We also demonstrate that our method is faster in finding preimages of multiple passwords than the methods proposed earlier. We tested the methods with five, ten and fifty randomised alphanumeric passwords. The results show that our method is many times faster than the original method of Saarinen and almost three times faster than the improved method proposed by Halunen et al. Furthermore, we argue that the methods presented previously and our method are essentially the only significantly different methods derivable from Saarinen's work.

Original languageEnglish
Title of host publicationInternational Conference on Availability, Reliability and Security, ARES 2009
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages499-503
Number of pages5
ISBN (Electronic)978-0-7695-3564-7
ISBN (Print)978-1-4244-3572-2
DOIs
Publication statusPublished - 12 Oct 2009
MoE publication typeNot Eligible
EventInternational Conference on Availability, Reliability and Security, ARES 2009 - Fukuoka, Japan
Duration: 16 Mar 200919 Mar 2009

Conference

ConferenceInternational Conference on Availability, Reliability and Security, ARES 2009
CountryJapan
CityFukuoka
Period16/03/0919/03/09

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Keywords

  • Hash function
  • preimage attack
  • VSH
  • password security

Cite this

Halunen, K., Rikula, P., & Röning, J. (2009). Finding preimages of multiple passwords secured with VSH. In International Conference on Availability, Reliability and Security, ARES 2009 (pp. 499-503). [5066516] IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/ARES.2009.25