Skip to main navigation
Skip to search
Skip to main content
Sort by
Keyphrases
Metal Film
100%
Finite-difference Time-domain
100%
Subwavelength Aperture
100%
Time Domain Study
100%
Light Spot
75%
Finite-difference Time-domain Simulation
50%
Semitransparent
50%
Areal Density
25%
Nanometre
25%
Incident Light
25%
Plane Wave
25%
Diffraction
25%
Transmittance
25%
Free Space
25%
Lithography
25%
Data Storage
25%
Light Trapping
25%
Fabry
25%
High Refractive Index Material
25%
Lateral Dimension
25%
Optical Technology
25%
Electromagnetic Waves
25%
Surface Waves
25%
Microscopy Data
25%
Surface Plasmon Polaritons
25%
Scattered Field Techniques
25%
Resonance Condition
25%
Surface Corrugation
25%
Incident Plane Wave
25%
Three-dimensional Finite-difference Time-domain
25%
Light Transmittance
25%
Otto Configuration
25%
Weak Light
25%
Storage Density
25%
Transmission Enhancement
25%
Oblique Incident
25%
Optical Light
25%
INIS
wavelengths
100%
apertures
100%
films
54%
metals
36%
layers
27%
data
27%
storage
27%
wave propagation
27%
density
18%
surfaces
18%
incidents
18%
simulation
9%
applications
9%
space
9%
transmission
9%
modeling
9%
nonlinear problems
9%
amplitudes
9%
cavities
9%
configuration
9%
dimensions
9%
resonance
9%
distance
9%
refractive index
9%
trapping
9%
scattering
9%
plasmons
9%
microscopy
9%
diffraction
9%
electromagnetic waves
9%
monochromatic radiation
9%
polaritons
9%
Engineering
Time Domain
100%
Propagating Wave
33%
Nanometre
33%
Time Domain Processing
33%
Film Plane
33%
Lithography
33%
Incident Plane Wave
33%
Light Incident
33%
Optical Technology
33%
Refractive Index
33%
Plane Wave
33%
Free Space
33%
Scattered Field
33%
Surface Plasmon
33%
Refractivity
33%
Physics
Finite Difference Methods
100%
Metal Films
100%
Transmittance
50%
Data Storage
50%
Plane Wave
50%
Finite Difference Time Domain Method
25%
Finite - Difference Time - Domain Simulation
25%
Refractivity
25%
Electromagnetic Radiation
25%
Far Field
25%
Surface Plasmon
25%
Polariton
25%
Surface Wave
25%
Material Science
Metal Film
100%
Finite Difference Method
100%
Film
50%
Density
50%
Surface (Surface Science)
50%
Lithography
25%
Refractive Index
25%
Surface Plasmons
25%