Abstract
A thin, flat and single crystal membrane on which to
mount sensors is generally required for integration with
electronics through standard silicon processing
technology. We present an approach to producing single
crystal membranes of germanium with in-built tensile
strain, which serves to keep the membrane flat and ripple
free, and demonstrate a 600 nm thick, free-standing 1 mm2
Ge membrane. We convert the fabrication technique into an
integrated-circuit compatible wafer scale process to
produce 60 nm thin membranes with large areas of 3.5 mm2.
The single crystal Ge membrane provides an excellent
platform for further epitaxial growth or deposition of
materials
Original language | English |
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Pages (from-to) | 93-98 |
Number of pages | 5 |
Journal | Solid-State Electronics |
Volume | 98 |
Issue number | August |
DOIs | |
Publication status | Published - 2014 |
MoE publication type | A1 Journal article-refereed |
Keywords
- Epitaxy
- Ge
- Germanium
- KOH
- Membrane
- TMAH