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Flat single crystal Ge membranes for sensors and opto-electronic integrated circuitry

  • V.A. Shah*
  • , M. Myronov
  • , S.D. Rhead
  • , J.E. Halpin
  • , Andrey Shchepetov
  • , M.J. Prest
  • , Mika Prunnila
  • , T.E. Whall
  • , E.H.C. Parker
  • , D.R. Leadley
  • *Corresponding author for this work
    • University of Warwick (WMG)

    Research output: Contribution to journalArticleScientificpeer-review

    Abstract

    A thin, flat and single crystal membrane on which to mount sensors is generally required for integration with electronics through standard silicon processing technology. We present an approach to producing single crystal membranes of germanium with in-built tensile strain, which serves to keep the membrane flat and ripple free, and demonstrate a 600 nm thick, free-standing 1 mm² Ge membrane. We convert the fabrication technique into an integrated-circuit compatible wafer scale process to produce 60 nm thin membranes with large areas of 3.5 mm². The single crystal Ge membrane provides an excellent platform for further epitaxial growth or deposition of materials
    Original languageEnglish
    Pages (from-to)93-98
    JournalSolid-State Electronics
    Volume98
    Issue numberAugust
    DOIs
    Publication statusPublished - 2014
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Epitaxy
    • Ge
    • Germanium
    • KOH
    • Membrane
    • TMAH

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