From technology assessment to responsible research and innovation (RRI)

John Pearson, Robert Gianni, Veikko Ikonen, Hossam Haick

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    2 Citations (Scopus)

    Abstract

    How can technology assessment methodologies be developed to move ethical questions to the forefront of enquiry? This methodological question was one of the key factors in an exercise in Responsible Research and Innovation carried out as part of SNIFFPHONE, a project on medical diagnostics. This paper discusses the methods used to apply Responsible Research and Innovation (RRI) in SNIFFPHONE, one of the European Commission's H2020 projects. In addition we will describe shortly implementation plan and first activities of RRI in another H2020 project, called BODEGA. The aim of the project is to build an expertise at the European level about human factors in future smart borders (e.g. ABC gates, video based risk analysis) in a way to enhance its efficiency without negative side effects.
    Original languageEnglish
    Title of host publicationFuture Technologies Conference (FTC)
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages1189-1198
    ISBN (Electronic)978-1-5090-4171-8
    ISBN (Print)978-1-5090-4172-5
    DOIs
    Publication statusPublished - 19 Jan 2016
    MoE publication typeA4 Article in a conference publication
    EventFuture Technologies Conference - Hyatt Fisherman's Wharf, San Francisco, United States
    Duration: 6 Dec 20167 Dec 2016

    Conference

    ConferenceFuture Technologies Conference
    Abbreviated titleFTC 2016
    CountryUnited States
    CitySan Francisco
    Period6/12/167/12/16

    Keywords

    • emerging technologies
    • ethics
    • Responsible Research and Innovation
    • technology assessmen

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  • Cite this

    Pearson, J., Gianni, R., Ikonen, V., & Haick, H. (2016). From technology assessment to responsible research and innovation (RRI). In Future Technologies Conference (FTC) (pp. 1189-1198). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/FTC.2016.7821752