Gate reflectometry for probing charge and spin states in linear Si MOS split-gate arrays
- L. Hutin
- , B. Bertrand
- , E. Chanrion
- , Heorhii Bohuslavskyi
- , F. Ansaloni
- , T.-Y. Yang
- , J. Michniewicz
- , D. J. Niegemann
- , C. Spence
- , T. Lundberg
- , A. Chatterjee
- , A. Crippa
- , J. Li
- , R. Maurand
- , X. Jehl
- , M. Sanquer
- , M. F. Gonzalez-Zalba
- , F. Kuemmeth
- , Y.-M. Niquet
- , S. De Franceschi
- University of Copenhagen
- Laboratoire d'électronique des technologies de l'information (LETI)
- French National Center for Scientific Research (CNRS)
- Interdisciplinary Research Institute of Grenoble (IRIG)
- University of Cambridge
Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
18
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(Scopus)