Grading of flour based on colour information

Harri Kopola, Elzbieta Marszalec, Risto Myllylä

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

The quality of flour is mainly determined on the basis of its color and protein content. Flour color grading is performed off-line from the milling process, in a laboratory. Thus there is a need for an instrument to measure flour color on-line and give an alarm if the result is outside the specified acceptable range. Based on the analysis of the color properties of flour and optical measurement methods used in experiments, two measurement approaches are proposed, the 'all spectrum method' and the 'abridged spectrum method.' Taking into account the costs of the sensor to be used under real quality testing conditions, the method based on the abridged spectrum is regarded as more appropriate. This paper describes a design for a four-channel color measuring system with an optical fiber sensor head. The sensor has been employed for the practical implementation of the method under laboratory conditions, giving satisfactory results.
Original languageEnglish
Title of host publicationOptics in Agriculture and Forestry
EditorsJames A. DeShazer, George E. Meyer
Place of PublicationBellingham
PublisherInternational Society for Optics and Photonics SPIE
Pages273-284
ISBN (Print)978-0-8194-1678-0
DOIs
Publication statusPublished - 1992
MoE publication typeA4 Article in a conference publication
EventApplications in Optical Science and Engineering - Boston, United States
Duration: 15 Nov 199220 Nov 1992

Publication series

SeriesProceedings of SPIE
Volume1836
ISSN0277-786X

Conference

ConferenceApplications in Optical Science and Engineering
CountryUnited States
CityBoston
Period15/11/9220/11/92

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    Kopola, H., Marszalec, E., & Myllylä, R. (1992). Grading of flour based on colour information. In J. A. DeShazer, & G. E. Meyer (Eds.), Optics in Agriculture and Forestry (pp. 273-284). International Society for Optics and Photonics SPIE. Proceedings of SPIE, Vol.. 1836 https://doi.org/10.1117/12.144036