Abstract
Results of investigation of n-type Bi2-xMnxTe3with x≈0.025 grown by the Bridgman method are presented. Structural properties are studied by means of x-ray diffraction, EDX and positron lifetime spectroscopy. Results of AC magnetic susceptibility measurements and electronic magneto-transport measurements show existence of ferromagnetic phase transition at 5.3 K. Effects of the phase transition on the electronic transport properties are studied.
Original language | English |
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Pages (from-to) | 636-639 |
Number of pages | 4 |
Journal | Journal of Crystal Growth |
Volume | 401 |
DOIs | |
Publication status | Published - 1 Sept 2014 |
MoE publication type | A1 Journal article-refereed |
Keywords
- A1. Characterization
- A1. Solid solutions
- B1. Bismuth compounds
- B2. Diluted magnetic semiconductor
- B2. Magnetic materials