Results of investigation of n-type Bi2-xMnxTe3with x≈0.025 grown by the Bridgman method are presented. Structural properties are studied by means of x-ray diffraction, EDX and positron lifetime spectroscopy. Results of AC magnetic susceptibility measurements and electronic magneto-transport measurements show existence of ferromagnetic phase transition at 5.3 K. Effects of the phase transition on the electronic transport properties are studied.
- A1. Characterization
- A1. Solid solutions
- B1. Bismuth compounds
- B2. Diluted magnetic semiconductor
- B2. Magnetic materials