High accuracy laser diffractometer

Angle-scale traceability by the error separation method with a grating

Research output: Contribution to journalArticleScientificpeer-review

15 Citations (Scopus)

Abstract

Laser diffractometer constructed at MIKES for calibration of pitches of 1D and 2D gratings is based on the Littrow configuration. The grating is rotated by a rotary table. In order to obtain optimal beam quality a fibre-coupled frequency-doubled stabilized Nd:YAG laser is used as a light source and a CCD without internal reflections is used to detect the diffracted beam position. The angle corresponding to the Littrow null position is calculated using a linear fit to equidistantly spaced angles around the null position, which reduces the effect of nonlinearity of the angle encoder scale. Pitch is calculated as a weighted average of the diffraction orders. Novel use of an uncalibrated 1D grating applied to classical error separation methods for angle calibration by full-circle subdivision is described. Diffraction angle measurements are repeated in many sample holder alignments rotated relative to the absolute angle scale. The sequences overlap so that the full circle of the angle scale is covered with multiple evenly distributed sequences, needed for circle-subdivision metrology. The average grating pitch over all sequences is used to separate angle scale errors and a correction table for the rotary table is calculated. The method was verified using a calibrated polygon and an autocollimator. Uncertainty estimates for the grating pitch calibration are given, e.g. the standard uncertainty of 9 pm for 2 µm grating.
Original languageEnglish
Number of pages8
JournalMeasurement Science and Technology
Volume20
Issue number8
DOIs
Publication statusPublished - 2009
MoE publication typeA1 Journal article-refereed

Fingerprint

Traceability
Diffraction gratings
Diffractometers
diffractometers
Gratings
High Accuracy
gratings
Calibration
Laser
Angle
Lasers
Diffraction
lasers
Optical fiber coupling
Beam quality
Table
Angle measurement
Charge coupled devices
subdivisions
Light sources

Cite this

@article{21e613515e764324a5fa86a3a7bae7cc,
title = "High accuracy laser diffractometer: Angle-scale traceability by the error separation method with a grating",
abstract = "Laser diffractometer constructed at MIKES for calibration of pitches of 1D and 2D gratings is based on the Littrow configuration. The grating is rotated by a rotary table. In order to obtain optimal beam quality a fibre-coupled frequency-doubled stabilized Nd:YAG laser is used as a light source and a CCD without internal reflections is used to detect the diffracted beam position. The angle corresponding to the Littrow null position is calculated using a linear fit to equidistantly spaced angles around the null position, which reduces the effect of nonlinearity of the angle encoder scale. Pitch is calculated as a weighted average of the diffraction orders. Novel use of an uncalibrated 1D grating applied to classical error separation methods for angle calibration by full-circle subdivision is described. Diffraction angle measurements are repeated in many sample holder alignments rotated relative to the absolute angle scale. The sequences overlap so that the full circle of the angle scale is covered with multiple evenly distributed sequences, needed for circle-subdivision metrology. The average grating pitch over all sequences is used to separate angle scale errors and a correction table for the rotary table is calculated. The method was verified using a calibrated polygon and an autocollimator. Uncertainty estimates for the grating pitch calibration are given, e.g. the standard uncertainty of 9 pm for 2 µm grating.",
author = "Virpi Korpelainen and A. Iho and Jeremias Sepp{\"a} and Antti Lassila",
year = "2009",
doi = "10.1088/0957-0233/20/8/084020",
language = "English",
volume = "20",
journal = "Measurement Science and Technology",
issn = "0957-0233",
publisher = "Institute of Physics IOP",
number = "8",

}

TY - JOUR

T1 - High accuracy laser diffractometer

T2 - Angle-scale traceability by the error separation method with a grating

AU - Korpelainen, Virpi

AU - Iho, A.

AU - Seppä, Jeremias

AU - Lassila, Antti

PY - 2009

Y1 - 2009

N2 - Laser diffractometer constructed at MIKES for calibration of pitches of 1D and 2D gratings is based on the Littrow configuration. The grating is rotated by a rotary table. In order to obtain optimal beam quality a fibre-coupled frequency-doubled stabilized Nd:YAG laser is used as a light source and a CCD without internal reflections is used to detect the diffracted beam position. The angle corresponding to the Littrow null position is calculated using a linear fit to equidistantly spaced angles around the null position, which reduces the effect of nonlinearity of the angle encoder scale. Pitch is calculated as a weighted average of the diffraction orders. Novel use of an uncalibrated 1D grating applied to classical error separation methods for angle calibration by full-circle subdivision is described. Diffraction angle measurements are repeated in many sample holder alignments rotated relative to the absolute angle scale. The sequences overlap so that the full circle of the angle scale is covered with multiple evenly distributed sequences, needed for circle-subdivision metrology. The average grating pitch over all sequences is used to separate angle scale errors and a correction table for the rotary table is calculated. The method was verified using a calibrated polygon and an autocollimator. Uncertainty estimates for the grating pitch calibration are given, e.g. the standard uncertainty of 9 pm for 2 µm grating.

AB - Laser diffractometer constructed at MIKES for calibration of pitches of 1D and 2D gratings is based on the Littrow configuration. The grating is rotated by a rotary table. In order to obtain optimal beam quality a fibre-coupled frequency-doubled stabilized Nd:YAG laser is used as a light source and a CCD without internal reflections is used to detect the diffracted beam position. The angle corresponding to the Littrow null position is calculated using a linear fit to equidistantly spaced angles around the null position, which reduces the effect of nonlinearity of the angle encoder scale. Pitch is calculated as a weighted average of the diffraction orders. Novel use of an uncalibrated 1D grating applied to classical error separation methods for angle calibration by full-circle subdivision is described. Diffraction angle measurements are repeated in many sample holder alignments rotated relative to the absolute angle scale. The sequences overlap so that the full circle of the angle scale is covered with multiple evenly distributed sequences, needed for circle-subdivision metrology. The average grating pitch over all sequences is used to separate angle scale errors and a correction table for the rotary table is calculated. The method was verified using a calibrated polygon and an autocollimator. Uncertainty estimates for the grating pitch calibration are given, e.g. the standard uncertainty of 9 pm for 2 µm grating.

U2 - 10.1088/0957-0233/20/8/084020

DO - 10.1088/0957-0233/20/8/084020

M3 - Article

VL - 20

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

IS - 8

ER -