High-frequency periodic time-domain waveform measurement system

Markku Sipilä, Kari Lehtinen, Veikko Porra

Research output: Contribution to journalArticleScientificpeer-review

63 Citations (Scopus)

Abstract

A system is presented for the accurate measurement of high-frequency periodic time-domain voltage and current waveforms of a nonlinear microwave device.
The measurements are performed in the time domain using a high-speed sampling oscilloscope. The results are Fourier-transformed into the frequency domain for error correction and then back into the time domain. An error-correction algorithm is presented that makes it possible to obtain accurate waveforms in spite of nonideal system components.
Practical difficulties in measurement-system characterization are also discussed. An accurate circuit model for the measurement fixture is developed and its element values are determined. Measurement results are given showing the waveforms in a microwave transistor operated in the nonlinear region.
The errors caused by signal processing are discussed
Original languageEnglish
Pages (from-to)1397-1405
JournalIEEE Transactions on Microwave Theory and Techniques
Volume36
Issue number10
DOIs
Publication statusPublished - 1988
MoE publication typeA1 Journal article-refereed

Fingerprint

waveforms
Error correction
microwaves
Microwave devices
fixtures
oscilloscopes
signal processing
Signal processing
Transistors
transistors
sampling
Microwaves
high speed
Sampling
Networks (circuits)
Electric potential
electric potential

Cite this

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title = "High-frequency periodic time-domain waveform measurement system",
abstract = "A system is presented for the accurate measurement of high-frequency periodic time-domain voltage and current waveforms of a nonlinear microwave device. The measurements are performed in the time domain using a high-speed sampling oscilloscope. The results are Fourier-transformed into the frequency domain for error correction and then back into the time domain. An error-correction algorithm is presented that makes it possible to obtain accurate waveforms in spite of nonideal system components. Practical difficulties in measurement-system characterization are also discussed. An accurate circuit model for the measurement fixture is developed and its element values are determined. Measurement results are given showing the waveforms in a microwave transistor operated in the nonlinear region. The errors caused by signal processing are discussed",
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High-frequency periodic time-domain waveform measurement system. / Sipilä, Markku; Lehtinen, Kari; Porra, Veikko.

In: IEEE Transactions on Microwave Theory and Techniques, Vol. 36, No. 10, 1988, p. 1397-1405.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - High-frequency periodic time-domain waveform measurement system

AU - Sipilä, Markku

AU - Lehtinen, Kari

AU - Porra, Veikko

PY - 1988

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N2 - A system is presented for the accurate measurement of high-frequency periodic time-domain voltage and current waveforms of a nonlinear microwave device. The measurements are performed in the time domain using a high-speed sampling oscilloscope. The results are Fourier-transformed into the frequency domain for error correction and then back into the time domain. An error-correction algorithm is presented that makes it possible to obtain accurate waveforms in spite of nonideal system components. Practical difficulties in measurement-system characterization are also discussed. An accurate circuit model for the measurement fixture is developed and its element values are determined. Measurement results are given showing the waveforms in a microwave transistor operated in the nonlinear region. The errors caused by signal processing are discussed

AB - A system is presented for the accurate measurement of high-frequency periodic time-domain voltage and current waveforms of a nonlinear microwave device. The measurements are performed in the time domain using a high-speed sampling oscilloscope. The results are Fourier-transformed into the frequency domain for error correction and then back into the time domain. An error-correction algorithm is presented that makes it possible to obtain accurate waveforms in spite of nonideal system components. Practical difficulties in measurement-system characterization are also discussed. An accurate circuit model for the measurement fixture is developed and its element values are determined. Measurement results are given showing the waveforms in a microwave transistor operated in the nonlinear region. The errors caused by signal processing are discussed

U2 - 10.1109/22.6087

DO - 10.1109/22.6087

M3 - Article

VL - 36

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EP - 1405

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

SN - 0018-9480

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