Abstract
A system is presented for the accurate measurement of high-frequency periodic time-domain voltage and current waveforms of a nonlinear microwave device.
The measurements are performed in the time domain using a high-speed sampling oscilloscope. The results are Fourier-transformed into the frequency domain for error correction and then back into the time domain. An error-correction algorithm is presented that makes it possible to obtain accurate waveforms in spite of nonideal system components. Practical difficulties in measurement-system characterization are also discussed. An accurate circuit model for the measurement fixture is developed and its element values are determined. Measurement results are given showing the waveforms in a microwave transistor operated in the nonlinear region. The errors caused by signal processing are discussed.
The measurements are performed in the time domain using a high-speed sampling oscilloscope. The results are Fourier-transformed into the frequency domain for error correction and then back into the time domain. An error-correction algorithm is presented that makes it possible to obtain accurate waveforms in spite of nonideal system components. Practical difficulties in measurement-system characterization are also discussed. An accurate circuit model for the measurement fixture is developed and its element values are determined. Measurement results are given showing the waveforms in a microwave transistor operated in the nonlinear region. The errors caused by signal processing are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 1397-1405 |
| Journal | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 36 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 1988 |
| MoE publication type | A1 Journal article-refereed |