High-frequency periodic time-domain waveform measurement system

Markku Sipilä, Kari Lehtinen, Veikko Porra

Research output: Contribution to journalArticleScientificpeer-review

65 Citations (Scopus)

Abstract

A system is presented for the accurate measurement of high-frequency periodic time-domain voltage and current waveforms of a nonlinear microwave device.
The measurements are performed in the time domain using a high-speed sampling oscilloscope. The results are Fourier-transformed into the frequency domain for error correction and then back into the time domain. An error-correction algorithm is presented that makes it possible to obtain accurate waveforms in spite of nonideal system components. Practical difficulties in measurement-system characterization are also discussed. An accurate circuit model for the measurement fixture is developed and its element values are determined. Measurement results are given showing the waveforms in a microwave transistor operated in the nonlinear region. The errors caused by signal processing are discussed.
Original languageEnglish
Pages (from-to)1397-1405
JournalIEEE Transactions on Microwave Theory and Techniques
Volume36
Issue number10
DOIs
Publication statusPublished - 1988
MoE publication typeA1 Journal article-refereed

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