Abstract
An easy-to-implement non-optical shear-force detection setup for
tip–sample distance regulation in scanning near-field optical microscopy
is demonstrated. The detection method is based on attaching the
near-field probe to a piezoelectric tube resulting in excellent
mechanical contact between tip and detector. The main advantages of the
method are good signal-to-background contrast and thus potential for
high sensitivity. The method is demonstrated by obtaining approach
curves of silicon surfaces. The suitability for optical experiments is
further shown by measuring the near-field intensity distribution of the
emission of a semiconductor laser.
| Original language | English |
|---|---|
| Pages (from-to) | 651-656 |
| Number of pages | 6 |
| Journal | Optics and Laser Technology |
| Volume | 36 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 2004 |
| MoE publication type | A1 Journal article-refereed |
Keywords
- scanning near-field optical microscopy
- non-optical shear-force detection
- laser characterization
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Cite this
Lindfors, K., Kapulainen, M., Ryytty, P., & Kaivola, M. (2004). High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy. Optics and Laser Technology, 36(8), 651-656. https://doi.org/10.1016/j.optlastec.2004.01.018