High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy

Klas Lindfors (Corresponding Author), Markku Kapulainen, Pasi Ryytty, Matti Kaivola

Research output: Contribution to journalArticleScientificpeer-review

7 Citations (Scopus)

Abstract

An easy-to-implement non-optical shear-force detection setup for tip–sample distance regulation in scanning near-field optical microscopy is demonstrated. The detection method is based on attaching the near-field probe to a piezoelectric tube resulting in excellent mechanical contact between tip and detector. The main advantages of the method are good signal-to-background contrast and thus potential for high sensitivity. The method is demonstrated by obtaining approach curves of silicon surfaces. The suitability for optical experiments is further shown by measuring the near-field intensity distribution of the emission of a semiconductor laser.
Original languageEnglish
Pages (from-to)651-656
Number of pages6
JournalOptics and Laser Technology
Volume36
Issue number8
DOIs
Publication statusPublished - 2004
MoE publication typeA1 Journal article-refereed

Fingerprint

Near field scanning optical microscopy
Silicon
Semiconductor lasers
near fields
tubes
shear
microscopy
Detectors
scanning
sensitivity
sensors
Sensors
Experiments
semiconductor lasers
probes
detectors
silicon
curves

Keywords

  • scanning near-field optical microscopy
  • non-optical shear-force detection
  • laser characterization

Cite this

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title = "High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy",
abstract = "An easy-to-implement non-optical shear-force detection setup for tip–sample distance regulation in scanning near-field optical microscopy is demonstrated. The detection method is based on attaching the near-field probe to a piezoelectric tube resulting in excellent mechanical contact between tip and detector. The main advantages of the method are good signal-to-background contrast and thus potential for high sensitivity. The method is demonstrated by obtaining approach curves of silicon surfaces. The suitability for optical experiments is further shown by measuring the near-field intensity distribution of the emission of a semiconductor laser.",
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volume = "36",
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High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy. / Lindfors, Klas (Corresponding Author); Kapulainen, Markku; Ryytty, Pasi; Kaivola, Matti.

In: Optics and Laser Technology, Vol. 36, No. 8, 2004, p. 651-656.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy

AU - Lindfors, Klas

AU - Kapulainen, Markku

AU - Ryytty, Pasi

AU - Kaivola, Matti

PY - 2004

Y1 - 2004

N2 - An easy-to-implement non-optical shear-force detection setup for tip–sample distance regulation in scanning near-field optical microscopy is demonstrated. The detection method is based on attaching the near-field probe to a piezoelectric tube resulting in excellent mechanical contact between tip and detector. The main advantages of the method are good signal-to-background contrast and thus potential for high sensitivity. The method is demonstrated by obtaining approach curves of silicon surfaces. The suitability for optical experiments is further shown by measuring the near-field intensity distribution of the emission of a semiconductor laser.

AB - An easy-to-implement non-optical shear-force detection setup for tip–sample distance regulation in scanning near-field optical microscopy is demonstrated. The detection method is based on attaching the near-field probe to a piezoelectric tube resulting in excellent mechanical contact between tip and detector. The main advantages of the method are good signal-to-background contrast and thus potential for high sensitivity. The method is demonstrated by obtaining approach curves of silicon surfaces. The suitability for optical experiments is further shown by measuring the near-field intensity distribution of the emission of a semiconductor laser.

KW - scanning near-field optical microscopy

KW - non-optical shear-force detection

KW - laser characterization

U2 - 10.1016/j.optlastec.2004.01.018

DO - 10.1016/j.optlastec.2004.01.018

M3 - Article

VL - 36

SP - 651

EP - 656

JO - Optics and Laser Technology

JF - Optics and Laser Technology

SN - 0030-3992

IS - 8

ER -