Holistic information security management in multi-organization environment

Timo Wiander, Reijo Savola, Kaarina Karppinen, Mikko Rapeli

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Abstract

    Digital convergence, the growing complexity of subcontracting networks and the rise in new, unknown risks call for a new paradigm in information security management. Joint operation agreements between organizations as well as demands from third party actors, such as government and environmental activists, require novel information security management procedures that manage the associated information systems as a whole – from the political, social and legal point of view in addition to the traditional information security view. To tackle these uprising issues we propose holistic handling for risk management and information security management and assurance.
    Original languageEnglish
    Title of host publicationProceedings of the International Symposium of Industrial Electronics (ISIE) 2006
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages2942-2947
    ISBN (Print)1-4244-0497-5, 1-4244-0496-7
    DOIs
    Publication statusPublished - 2006
    MoE publication typeA4 Article in a conference publication
    EventInternational Symposium of Industrial Electronics, ISIE 2006 - Montréal, Canada
    Duration: 9 Jul 200613 Jul 2006

    Publication series

    SeriesIEEE International Symposium on Industrial Electronics
    Volume2006
    ISSN2163-5137

    Conference

    ConferenceInternational Symposium of Industrial Electronics, ISIE 2006
    Abbreviated titleISIE 2006
    CountryCanada
    CityMontréal
    Period9/07/0613/07/06

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    Cite this

    Wiander, T., Savola, R., Karppinen, K., & Rapeli, M. (2006). Holistic information security management in multi-organization environment. In Proceedings of the International Symposium of Industrial Electronics (ISIE) 2006 (pp. 2942-2947). IEEE Institute of Electrical and Electronic Engineers . IEEE International Symposium on Industrial Electronics, Vol.. 2006 https://doi.org/10.1109/ISIE.2006.296084