Hologram based compact ranges for antenna and RCS testing at submm waves

Anne Lonnqvist, Juha Ala-Laurinaho, Janne Hakli, Tomi Koskinen, Juha Mallat, Ville Viikari, Antti V. Raisanen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

Compact ranges based on amplitude and phase holograms have been developed and shown to be applicable at submillimeter wavelengths. Amplitude hologram based compact range has been successfully used for measuring a 1.5 m reflector antenna at 322 GHz. A phase hologram based compact range has been demonstrated for RCS measurements at 310 GHz.

Original languageEnglish
Title of host publicationANTEM 2005
Subtitle of host publication11th International Symposium on Antenna Technology and Applied Electromagnetics, Conference Proceedings
PublisherInstitute of Electrical and Electronic Engineers IEEE
ISBN (Print)978-0-9738425-0-0
DOIs
Publication statusPublished - 1 Jan 2005
MoE publication typeA4 Article in a conference publication
Event11th International Symposium on Antenna Technology and Applied Electromagnetics, ANTEM 2005 - Saint-Malo, France
Duration: 15 Jun 200517 Jun 2005
Conference number: 11

Conference

Conference11th International Symposium on Antenna Technology and Applied Electromagnetics, ANTEM 2005
Abbreviated titleANTEM 2005
CountryFrance
CitySaint-Malo
Period15/06/0517/06/05

Fingerprint

Holograms
antennas
Antennas
reflector antennas
Testing
Antenna reflectors
wavelengths
Wavelength

Cite this

Lonnqvist, A., Ala-Laurinaho, J., Hakli, J., Koskinen, T., Mallat, J., Viikari, V., & Raisanen, A. V. (2005). Hologram based compact ranges for antenna and RCS testing at submm waves. In ANTEM 2005 : 11th International Symposium on Antenna Technology and Applied Electromagnetics, Conference Proceedings [7852117] Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/ANTEM.2005.7852117
Lonnqvist, Anne ; Ala-Laurinaho, Juha ; Hakli, Janne ; Koskinen, Tomi ; Mallat, Juha ; Viikari, Ville ; Raisanen, Antti V. / Hologram based compact ranges for antenna and RCS testing at submm waves. ANTEM 2005 : 11th International Symposium on Antenna Technology and Applied Electromagnetics, Conference Proceedings. Institute of Electrical and Electronic Engineers IEEE, 2005.
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author = "Anne Lonnqvist and Juha Ala-Laurinaho and Janne Hakli and Tomi Koskinen and Juha Mallat and Ville Viikari and Raisanen, {Antti V.}",
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Lonnqvist, A, Ala-Laurinaho, J, Hakli, J, Koskinen, T, Mallat, J, Viikari, V & Raisanen, AV 2005, Hologram based compact ranges for antenna and RCS testing at submm waves. in ANTEM 2005 : 11th International Symposium on Antenna Technology and Applied Electromagnetics, Conference Proceedings., 7852117, Institute of Electrical and Electronic Engineers IEEE, 11th International Symposium on Antenna Technology and Applied Electromagnetics, ANTEM 2005, Saint-Malo, France, 15/06/05. https://doi.org/10.1109/ANTEM.2005.7852117

Hologram based compact ranges for antenna and RCS testing at submm waves. / Lonnqvist, Anne; Ala-Laurinaho, Juha; Hakli, Janne; Koskinen, Tomi; Mallat, Juha; Viikari, Ville; Raisanen, Antti V.

ANTEM 2005 : 11th International Symposium on Antenna Technology and Applied Electromagnetics, Conference Proceedings. Institute of Electrical and Electronic Engineers IEEE, 2005. 7852117.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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AB - Compact ranges based on amplitude and phase holograms have been developed and shown to be applicable at submillimeter wavelengths. Amplitude hologram based compact range has been successfully used for measuring a 1.5 m reflector antenna at 322 GHz. A phase hologram based compact range has been demonstrated for RCS measurements at 310 GHz.

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Lonnqvist A, Ala-Laurinaho J, Hakli J, Koskinen T, Mallat J, Viikari V et al. Hologram based compact ranges for antenna and RCS testing at submm waves. In ANTEM 2005 : 11th International Symposium on Antenna Technology and Applied Electromagnetics, Conference Proceedings. Institute of Electrical and Electronic Engineers IEEE. 2005. 7852117 https://doi.org/10.1109/ANTEM.2005.7852117