Hydrogen migration in diamond-like carbon films

E. Vainonen; Jari Likonen; T. Ahlgren; P. Haussalo; J. Keinonen

doi:10.1063/1.365741

Hydrogen migration in diamond-like carbon films

E. Vainonen
, Jari Likonen
, T. Ahlgren
, P. Haussalo
, J. Keinonen

Not published at VTT

Research output: Contribution to journal › Article › Scientific › peer-review

28 Citations (Scopus)

Abstract

Properties of physical vapor deposited diamondlike carbon (DLC) films and the migration of hydrogen in H+ and 4He+ ion implanted and hydrogen co-deposited DLC films have been studied. Measurements utilizing Rutherford backscattering spectrometry showed that the films studied have an average mass density of 2.6±0.1 g/cm3. The bonding ratio sp3/sp2 is typically 70% measured with the electron spectroscopy for chemical analysis technique. Impurities and their depth distributions were deduced from the particle induced x-ray emission and secondary ion mass spectrometry (SIMS) measurements. Distributions of implanted and co-deposited hydrogen were measured by the nuclear resonance reaction 1H(15N,αγ)12C and SIMS. It was found that annealing behavior of implanted H in DLC has a diffusion like character. The obtained diffusion coefficients resulted in the activation energy of 2.0±0.1 eV. It was observed that in H co-deposited DLC films the temperature of H release varied between 950 and 1070 °C depending on the H concentration.

Original language	English
Pages (from-to)	3791-3796
Number of pages	6
Journal	Journal of Applied Physics
Volume	82
Issue number	8
DOIs	https://doi.org/10.1063/1.365741
Publication status	Published - 1997
MoE publication type	A1 Journal article-refereed

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title = "Hydrogen migration in diamond-like carbon films",

abstract = "Properties of physical vapor deposited diamondlike carbon (DLC) films and the migration of hydrogen in H+ and 4He+ ion implanted and hydrogen co-deposited DLC films have been studied. Measurements utilizing Rutherford backscattering spectrometry showed that the films studied have an average mass density of 2.6±0.1 g/cm3. The bonding ratio sp3/sp2 is typically 70\% measured with the electron spectroscopy for chemical analysis technique. Impurities and their depth distributions were deduced from the particle induced x-ray emission and secondary ion mass spectrometry (SIMS) measurements. Distributions of implanted and co-deposited hydrogen were measured by the nuclear resonance reaction 1H(15N,αγ)12C and SIMS. It was found that annealing behavior of implanted H in DLC has a diffusion like character. The obtained diffusion coefficients resulted in the activation energy of 2.0±0.1 eV. It was observed that in H co-deposited DLC films the temperature of H release varied between 950 and 1070 °C depending on the H concentration.",

author = "E. Vainonen and Jari Likonen and T. Ahlgren and P. Haussalo and J. Keinonen",

note = "Project code: KET41461",

year = "1997",

doi = "10.1063/1.365741",

language = "English",

volume = "82",

pages = "3791--3796",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics (AIP)",

number = "8",

}

TY - JOUR

T1 - Hydrogen migration in diamond-like carbon films

AU - Vainonen, E.

AU - Likonen, Jari

AU - Ahlgren, T.

AU - Haussalo, P.

AU - Keinonen, J.

N1 - Project code: KET41461

PY - 1997

Y1 - 1997

N2 - Properties of physical vapor deposited diamondlike carbon (DLC) films and the migration of hydrogen in H+ and 4He+ ion implanted and hydrogen co-deposited DLC films have been studied. Measurements utilizing Rutherford backscattering spectrometry showed that the films studied have an average mass density of 2.6±0.1 g/cm3. The bonding ratio sp3/sp2 is typically 70% measured with the electron spectroscopy for chemical analysis technique. Impurities and their depth distributions were deduced from the particle induced x-ray emission and secondary ion mass spectrometry (SIMS) measurements. Distributions of implanted and co-deposited hydrogen were measured by the nuclear resonance reaction 1H(15N,αγ)12C and SIMS. It was found that annealing behavior of implanted H in DLC has a diffusion like character. The obtained diffusion coefficients resulted in the activation energy of 2.0±0.1 eV. It was observed that in H co-deposited DLC films the temperature of H release varied between 950 and 1070 °C depending on the H concentration.

AB - Properties of physical vapor deposited diamondlike carbon (DLC) films and the migration of hydrogen in H+ and 4He+ ion implanted and hydrogen co-deposited DLC films have been studied. Measurements utilizing Rutherford backscattering spectrometry showed that the films studied have an average mass density of 2.6±0.1 g/cm3. The bonding ratio sp3/sp2 is typically 70% measured with the electron spectroscopy for chemical analysis technique. Impurities and their depth distributions were deduced from the particle induced x-ray emission and secondary ion mass spectrometry (SIMS) measurements. Distributions of implanted and co-deposited hydrogen were measured by the nuclear resonance reaction 1H(15N,αγ)12C and SIMS. It was found that annealing behavior of implanted H in DLC has a diffusion like character. The obtained diffusion coefficients resulted in the activation energy of 2.0±0.1 eV. It was observed that in H co-deposited DLC films the temperature of H release varied between 950 and 1070 °C depending on the H concentration.

U2 - 10.1063/1.365741

DO - 10.1063/1.365741

M3 - Article

SN - 0021-8979

VL - 82

SP - 3791

EP - 3796

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 8

ER -

Hydrogen migration in diamond-like carbon films

Abstract

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