Identification and surface structure of crystalline cellulose studied by atomic force microscopy

Lauri Kuutti, J. Peltonen, Jaakko Pere, Olle Teleman

Research output: Contribution to journalArticleScientificpeer-review

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Abstract

A combination of molecular modelling and atomic force microscopy (AFM) techniques was used to study the surface structure of crystalline cellulose. Two‐dimensional Fourier analysis of the AFM raw data gave crystal parameters as well as a highly filtered inverse‐transformed image. Molecular modelling was used to generate Connolly surfaces based on electron diffraction data for crystalline cellulose. The modelled surfaces were used to interpret the experimental AFM images. Monoclinic (inline image) crystal faces were identified. The method used enables the structural analysis of cellulose surfaces at the molecular level, where all biological processes involving cellulose take place.
Original languageEnglish
Pages (from-to)1-6
JournalJournal of Microscopy
Volume178
Issue number1
DOIs
Publication statusPublished - 1995
MoE publication typeA1 Journal article-refereed

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Atomic Force Microscopy
Cellulose
Biological Phenomena
Fourier Analysis
Electrons

Cite this

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title = "Identification and surface structure of crystalline cellulose studied by atomic force microscopy",
abstract = "A combination of molecular modelling and atomic force microscopy (AFM) techniques was used to study the surface structure of crystalline cellulose. Two‐dimensional Fourier analysis of the AFM raw data gave crystal parameters as well as a highly filtered inverse‐transformed image. Molecular modelling was used to generate Connolly surfaces based on electron diffraction data for crystalline cellulose. The modelled surfaces were used to interpret the experimental AFM images. Monoclinic (inline image) crystal faces were identified. The method used enables the structural analysis of cellulose surfaces at the molecular level, where all biological processes involving cellulose take place.",
author = "Lauri Kuutti and J. Peltonen and Jaakko Pere and Olle Teleman",
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Identification and surface structure of crystalline cellulose studied by atomic force microscopy. / Kuutti, Lauri; Peltonen, J.; Pere, Jaakko; Teleman, Olle.

In: Journal of Microscopy, Vol. 178, No. 1, 1995, p. 1-6.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Identification and surface structure of crystalline cellulose studied by atomic force microscopy

AU - Kuutti, Lauri

AU - Peltonen, J.

AU - Pere, Jaakko

AU - Teleman, Olle

N1 - Project code: BEL3009

PY - 1995

Y1 - 1995

N2 - A combination of molecular modelling and atomic force microscopy (AFM) techniques was used to study the surface structure of crystalline cellulose. Two‐dimensional Fourier analysis of the AFM raw data gave crystal parameters as well as a highly filtered inverse‐transformed image. Molecular modelling was used to generate Connolly surfaces based on electron diffraction data for crystalline cellulose. The modelled surfaces were used to interpret the experimental AFM images. Monoclinic (inline image) crystal faces were identified. The method used enables the structural analysis of cellulose surfaces at the molecular level, where all biological processes involving cellulose take place.

AB - A combination of molecular modelling and atomic force microscopy (AFM) techniques was used to study the surface structure of crystalline cellulose. Two‐dimensional Fourier analysis of the AFM raw data gave crystal parameters as well as a highly filtered inverse‐transformed image. Molecular modelling was used to generate Connolly surfaces based on electron diffraction data for crystalline cellulose. The modelled surfaces were used to interpret the experimental AFM images. Monoclinic (inline image) crystal faces were identified. The method used enables the structural analysis of cellulose surfaces at the molecular level, where all biological processes involving cellulose take place.

U2 - 10.1111/j.1365-2818.1995.tb03573.x

DO - 10.1111/j.1365-2818.1995.tb03573.x

M3 - Article

VL - 178

SP - 1

EP - 6

JO - Journal of Microscopy

JF - Journal of Microscopy

SN - 0022-2720

IS - 1

ER -