Image quality in automated visual web inspection

Jyrki Laitinen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

15 Citations (Scopus)

Abstract

In this study the relation between the performance of an imaging unit of a web inspection system and the final image quality is discussed. The basic idea is to analyze the results of the segmentation and feature extraction of defects in sample images as a function of imaging parameters. Determination of the quality of imaging and examples of the performance of a typical imaging unit are reviewed. The effect of the image quality on segmentation of the defects and feature extraction is analyzed in two cases: (1) The detection of small and low-contrast defects in paper inspection and (2) the depth of field considerations in steel inspection. Samples picked from the industrial manufacturing process are imaged using different imaging parameters and the defect areas in the images are segmented in order to illustrate the dependence of the system performance on the quality of imaging. Several segmentation methods are applied. These include direct thresholding, edge-based filtering, matched filtering and morphological filtering. The contrast of certain type of defects can be improved before segmentation by averaging the input data line by line. The signal processing methods presented here are computationally simple due to the need for high-speed real-time implementation in practical inspection.
Original languageEnglish
Title of host publicationMachine Vision Applications in Industrial Inspection V
EditorsA. Ravishankar Rao, Ning S. Chang
Place of PublicationBellingham
PublisherInternational Society for Optics and Photonics SPIE
Pages78-89
ISBN (Print)978-0-8194-2440-2
DOIs
Publication statusPublished - 1997
MoE publication typeA4 Article in a conference publication
EventMachine Vision Applications in Industrial Inspection VI - San Jose, United States
Duration: 24 Jan 199830 Jan 1998

Publication series

SeriesProceedings of SPIE
Volume3029
ISSN0277-786X

Conference

ConferenceMachine Vision Applications in Industrial Inspection VI
Country/TerritoryUnited States
CitySan Jose
Period24/01/9830/01/98

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