Impedance spectroscopy of the polymer thick film resistor/conductor interface

Salme Jussila, Henrik Stubb, Seppo Pienimaa

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

Impedance spectroscopy has been used to study the electric properties of screen-printed polymer thick film (PTF) resistors over the frequency range 10 Hz - 500 MHz. With a suitable test pattern it was possible to separate the impedance response of the resistor/conductor interface from that of the resistive element itself. This proved to be useful when analysing, whether the manufacturing parameters have more influence on the properties of the interface or the bulk resistor. The main varied manufacturing parameters were curing method, curing temperature and the resistor/conductor interface (pure copper vs. silver treated copper). Furthermore, the test components were kept for 600 hours in a humid environment (85°/ 85% RH), and after this the impedance measurements were repeated. Analysis of the effects of these manufacturing and environmental conditions on the electrical properties of PTF resistors are presented.
Original languageEnglish
Title of host publicationElectronic Packaging Materials Science V
EditorsP. Ho, R.J. Jaccodine, K. Jackson, Edwin D. Lillie
Place of PublicationPittsburgh
PublisherMaterials Research Society
Pages41-46
ISBN (Print)978-1-55899-095-1
DOIs
Publication statusPublished - 1991
MoE publication typeA4 Article in a conference publication
EventElectronic packaging materials science V - Boston, United States
Duration: 26 Nov 199029 Nov 1990

Publication series

SeriesMaterials Research Society Symposia Proceedings
Volume203
ISSN0272-9172

Conference

ConferenceElectronic packaging materials science V
Country/TerritoryUnited States
CityBoston
Period26/11/9029/11/90

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