Improved accuracy and robustness of electron density profiles from JET’s X-mode frequency-modulated continuous-wave reflectometers
- R.B. Morales*
- , Antti Salmi
- , P. Abreu
- , C. H.S. Amador
- , L. Appel
- , P. Carman
- , J. Fessey
- , J. Flanagan
- , M. Fontana
- , L. Frassinetti
- , C. Giroud
- , S. Hacquin
- , S. Heuraux
- , L. Meneses
- , G. Ronchi
- , R. Sabot
- , A. Silva
- , A. Sirinelli
- , G. Szepesi
- , D. Taylor
*Corresponding author for this work
Research output: Contribution to journal › Article › Scientific › peer-review
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