Engineering
Test Structure
100%
Inverter
100%
Electric Power Utilization
100%
Networks (Circuits)
100%
Reducing Power
100%
Input Signal
100%
Network Application
100%
Test Circuit
100%
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Floating Gate
100%
Integrated Circuit
100%
Polysilicon
100%
Keyphrases
Transistor Structure
100%
Neuron-MOS Transistor
100%
Integrated Neural Network
100%
Neural Network Circuit
100%
Transistor
25%
Input Signals
25%
Calibration Method
25%
Energy Consumption Reduction
25%
CMOS Technology
25%
Integrated Circuits
25%
Operation-based
25%
Polysilicon
25%
Signal Operation
25%
Area Consumption
25%
Multiple Input
25%
Channel Current
25%
MOSFET Structure
25%
Floating Gate
25%
Structure Calibration
25%
Input Threshold
25%
Threshold Operation
25%
Neuron CMOS Inverter
25%
Neural Network Applications
25%
Biological Neuron
25%
Weighted Sums
25%
Layout Area
25%
Computer Science
Reducing Power Consumption
100%
Discovered Device
100%
Neural Network Application
100%
Area Power Consumption
100%
Neural Network
100%
Integrated Circuit
100%
INIS
neural networks
100%
neurons
100%
mos transistors
100%
control
14%
applications
14%
devices
14%
operation
14%
power
14%
transistors
14%
accuracy
14%
signals
14%
calibration
14%
inverters
14%
integrated circuits
14%
mosfet
14%