Inclusion ratio based estimator for the mean length of the Boolean line segment model applied to nanocellulose

M. Niilo-Rämä, S. Kärkkäinen, D. Gasbarra, Timo Lappalainen

    Research output: Contribution to conferenceOther conference contributionScientificpeer-review

    Abstract

    A new method for estimating the mean length of line segments observed through a square shaped sampling window is introduced. The largest advantage of the method is that there is no need to measure the exact lengths of the segments. The method is based on the ratio of two biased intensity estimates obtained from minus- and plus-sampling. This method is applied for estimating the mean length of the fibres of nanocellulose from an AFM image.
    Original languageEnglish
    Publication statusPublished - 2013
    MoE publication typeNot Eligible
    Event11th European Congress of Stereology and Image Analysis - Kaiserslautern, Germany
    Duration: 9 Jul 201312 Jul 2013

    Conference

    Conference11th European Congress of Stereology and Image Analysis
    CountryGermany
    CityKaiserslautern
    Period9/07/1312/07/13

    Keywords

    • AFM image
    • Boolean model
    • mean length
    • minus-sampling
    • nanocellulose
    • plus-sampling

    Fingerprint Dive into the research topics of 'Inclusion ratio based estimator for the mean length of the Boolean line segment model applied to nanocellulose'. Together they form a unique fingerprint.

  • Cite this

    Niilo-Rämä, M., Kärkkäinen, S., Gasbarra, D., & Lappalainen, T. (2013). Inclusion ratio based estimator for the mean length of the Boolean line segment model applied to nanocellulose. 11th European Congress of Stereology and Image Analysis, Kaiserslautern, Germany.