Abstract
Charge can easily be induced on electronics or on other conducting parts
if they are exposed to external electrical fields. In production
facilities where sensitive electronics are handled, strong electrostatic
fields should be avoided due to the risk of causing electrostatic
discharges (ESDs) that could damage components. In electronics
manufacturing this is usually achieved by grounding all conductors and
removing all insulators from an ESD Protected Area (EPA) in the
facility. However, it is not always possible to remove all insulators
from the EPA as they are sometimes an essential part of the production
processes. In this case, a method of risk assessment is necessary to
evaluate safe operation. We have studied induction charging of a dummy
PWB (Printed Wiring Board) through a grounded MOSFET transistor, by
grounding it directly to metal or through the human body, when the PWB
is exposed to a static electric field. The experimental setup can easily
be turned into an induction charging probe by changing the MOSFET
transistor to a low leakage current, high voltage capacitor of suitable
size and measuring the voltage over this capacitor.
Original language | English |
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Pages (from-to) | 263-266 |
Number of pages | 4 |
Journal | Journal of Electrostatics |
Volume | 67 |
Issue number | 2-3 |
DOIs | |
Publication status | Published - 2009 |
MoE publication type | A1 Journal article-refereed |
Event | 11th International Conference on Electrostatics (Electrostatics 2009) - Valencia, Spain Duration: 27 May 2009 → 29 May 2009 |
Keywords
- Risk assessment
- Electrostatic discharge
- ESD sensitive devices