Influence of the Josephson junction on the impedance and noise of a resistive superconductive quantum interference device

Robert Soulen, William Fogle, Jack Colwell, Joshua Cohn, Heikki Seppä

    Research output: Contribution to journalArticleScientificpeer-review

    3 Citations (Scopus)

    Abstract

    The impedance and noise of a resistive superconductive quantum interference device (R‐SQUID) have been measured as a function of the dc and rf currents applied to it. The Josephson junction was adjustable so that data were also taken for several values of the junction critical current. The results were compared with the predictions of a resistively shunted junction (RSJ) model which takes into account the influence of the Josephson junction on the impedance and noise. The agreement was found to be quite good and demonstrates that the noise in the circuit is well understood. Use of the R‐SQUID as a noise thermometer below 1 K is assessed in terms of corrections due to the RSJ model. It is demonstrated how the dc and rf currents may be adjusted so that the total noise of the R‐SQUID is reduced to within 0.1% of the Johnson noise generated by the resistor alone. Under these conditions, the R‐SQUID may be used as a noise thermometer to determine thermodynamic temperature to this inaccuracy from 6 to 700 mK.
    Original languageEnglish
    Pages (from-to)5241-5249
    JournalJournal of Applied Physics
    Volume74
    Issue number8
    Publication statusPublished - 1993
    MoE publication typeA1 Journal article-refereed

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    Josephson junctions
    impedance
    interference
    thermometers
    resistors
    critical current
    thermodynamics
    predictions

    Keywords

    • Josephson junction

    Cite this

    Soulen, Robert ; Fogle, William ; Colwell, Jack ; Cohn, Joshua ; Seppä, Heikki. / Influence of the Josephson junction on the impedance and noise of a resistive superconductive quantum interference device. In: Journal of Applied Physics. 1993 ; Vol. 74, No. 8. pp. 5241-5249.
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    title = "Influence of the Josephson junction on the impedance and noise of a resistive superconductive quantum interference device",
    abstract = "The impedance and noise of a resistive superconductive quantum interference device (R‐SQUID) have been measured as a function of the dc and rf currents applied to it. The Josephson junction was adjustable so that data were also taken for several values of the junction critical current. The results were compared with the predictions of a resistively shunted junction (RSJ) model which takes into account the influence of the Josephson junction on the impedance and noise. The agreement was found to be quite good and demonstrates that the noise in the circuit is well understood. Use of the R‐SQUID as a noise thermometer below 1 K is assessed in terms of corrections due to the RSJ model. It is demonstrated how the dc and rf currents may be adjusted so that the total noise of the R‐SQUID is reduced to within 0.1{\%} of the Johnson noise generated by the resistor alone. Under these conditions, the R‐SQUID may be used as a noise thermometer to determine thermodynamic temperature to this inaccuracy from 6 to 700 mK.",
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    author = "Robert Soulen and William Fogle and Jack Colwell and Joshua Cohn and Heikki Sepp{\"a}",
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    Influence of the Josephson junction on the impedance and noise of a resistive superconductive quantum interference device. / Soulen, Robert; Fogle, William; Colwell, Jack; Cohn, Joshua; Seppä, Heikki.

    In: Journal of Applied Physics, Vol. 74, No. 8, 1993, p. 5241-5249.

    Research output: Contribution to journalArticleScientificpeer-review

    TY - JOUR

    T1 - Influence of the Josephson junction on the impedance and noise of a resistive superconductive quantum interference device

    AU - Soulen, Robert

    AU - Fogle, William

    AU - Colwell, Jack

    AU - Cohn, Joshua

    AU - Seppä, Heikki

    PY - 1993

    Y1 - 1993

    N2 - The impedance and noise of a resistive superconductive quantum interference device (R‐SQUID) have been measured as a function of the dc and rf currents applied to it. The Josephson junction was adjustable so that data were also taken for several values of the junction critical current. The results were compared with the predictions of a resistively shunted junction (RSJ) model which takes into account the influence of the Josephson junction on the impedance and noise. The agreement was found to be quite good and demonstrates that the noise in the circuit is well understood. Use of the R‐SQUID as a noise thermometer below 1 K is assessed in terms of corrections due to the RSJ model. It is demonstrated how the dc and rf currents may be adjusted so that the total noise of the R‐SQUID is reduced to within 0.1% of the Johnson noise generated by the resistor alone. Under these conditions, the R‐SQUID may be used as a noise thermometer to determine thermodynamic temperature to this inaccuracy from 6 to 700 mK.

    AB - The impedance and noise of a resistive superconductive quantum interference device (R‐SQUID) have been measured as a function of the dc and rf currents applied to it. The Josephson junction was adjustable so that data were also taken for several values of the junction critical current. The results were compared with the predictions of a resistively shunted junction (RSJ) model which takes into account the influence of the Josephson junction on the impedance and noise. The agreement was found to be quite good and demonstrates that the noise in the circuit is well understood. Use of the R‐SQUID as a noise thermometer below 1 K is assessed in terms of corrections due to the RSJ model. It is demonstrated how the dc and rf currents may be adjusted so that the total noise of the R‐SQUID is reduced to within 0.1% of the Johnson noise generated by the resistor alone. Under these conditions, the R‐SQUID may be used as a noise thermometer to determine thermodynamic temperature to this inaccuracy from 6 to 700 mK.

    KW - Josephson junction

    M3 - Article

    VL - 74

    SP - 5241

    EP - 5249

    JO - Journal of Applied Physics

    JF - Journal of Applied Physics

    SN - 0021-8979

    IS - 8

    ER -