Infrared analyzers for process measurements

Timo Hyvärinen, Jorma Lammasniemi, Jouko Malinen, Pentti Niemelä, Jussi Tenhunen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review


    Optical analysis techniques, infrared spectroscopy in the front end, are rapidly achieving new applications in process control. This progress is accelerated by the development of more rugged instrument constructions. This paper describes two analyzer techniques especially developed for use in demanding environments. First, the integrated multichannel detector techniques is suitable for applications where the measurement can be accomplished by using 2 to 4 wavelengths. This technique has been used to construct several compact, portable and battery-operated IR analyzers, and process analyzers which measure exactly simultaneously at each wavelength resulting in very high tolerance against rapid changes and flow of the process stream. Secondly, a miniaturized Fourier transform infrared (FTIR) spectrometer is being developed for use as an OEM module in specific process and laboratory instruments. Special attention has been paid to increase the resistance of FTIR technique to ambient vibrations. The module contains an integrated digital signal processing electronics for intelligent control of the spectrometer and for fast real time spectral data treatment. Application studies include on line measurement of the concentrations of diluted and colloidal organic detrimental substances, especially pitch components, in the circulating waters in paper machine wet end.
    Original languageEnglish
    Title of host publicationInfrared Technology XVIII
    EditorsBjörn F. Andresen, Freeman D. Shepherd
    Place of PublicationBellingham
    PublisherInternational Society for Optics and Photonics SPIE
    ISBN (Print)978-0-8194-0935-5
    Publication statusPublished - 1992
    MoE publication typeA4 Article in a conference publication
    EventInfrared technology XVIII - San Diego, United States
    Duration: 19 Jul 199222 Jul 1992

    Publication series

    SeriesProceedings of SPIE


    ConferenceInfrared technology XVIII
    Country/TerritoryUnited States
    CitySan Diego


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