Instantaneous frequency measurement system using four-wave mixing in an ultra-compact long silicon waveguide

Mattia Pagani, Blair Morrison, Yanbing Zhang, Alvaro Casas-Bedoya, Timo Aalto, Mikko Harjanne, Markku Kapulainen, Benjamin J. Eggleton, David Marpaung

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Abstract

We exploit the unique properties of a long thick silicon waveguide to harness Kerr nonlinearity with ultra-low loss for on-chip RF photonic signal processing. We demonstrate an instantaneous frequency measurement system with 40 GHz bandwidth and record-low measurement error.

Original languageEnglish
Title of host publication2015 European Conference on Optical Communication (ECOC)
PublisherInstitute of Electrical and Electronic Engineers IEEE
ISBN (Electronic)978-8-4608-1741-3
DOIs
Publication statusPublished - 30 Nov 2015
MoE publication typeA4 Article in a conference publication
Event41st European Conference on Optical Communication, ECOC 2015 - Valencia, Spain
Duration: 27 Sep 20151 Oct 2015

Conference

Conference41st European Conference on Optical Communication, ECOC 2015
Abbreviated titleECOC 2015
CountrySpain
CityValencia
Period27/09/151/10/15

Fingerprint

Four wave mixing
Silicon
Measurement errors
Photonics
Signal processing
Waveguides
Bandwidth

Cite this

Pagani, M., Morrison, B., Zhang, Y., Casas-Bedoya, A., Aalto, T., Harjanne, M., ... Marpaung, D. (2015). Instantaneous frequency measurement system using four-wave mixing in an ultra-compact long silicon waveguide. In 2015 European Conference on Optical Communication (ECOC) [7341976] Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/ECOC.2015.7341976
Pagani, Mattia ; Morrison, Blair ; Zhang, Yanbing ; Casas-Bedoya, Alvaro ; Aalto, Timo ; Harjanne, Mikko ; Kapulainen, Markku ; Eggleton, Benjamin J. ; Marpaung, David. / Instantaneous frequency measurement system using four-wave mixing in an ultra-compact long silicon waveguide. 2015 European Conference on Optical Communication (ECOC). Institute of Electrical and Electronic Engineers IEEE, 2015.
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abstract = "We exploit the unique properties of a long thick silicon waveguide to harness Kerr nonlinearity with ultra-low loss for on-chip RF photonic signal processing. We demonstrate an instantaneous frequency measurement system with 40 GHz bandwidth and record-low measurement error.",
author = "Mattia Pagani and Blair Morrison and Yanbing Zhang and Alvaro Casas-Bedoya and Timo Aalto and Mikko Harjanne and Markku Kapulainen and Eggleton, {Benjamin J.} and David Marpaung",
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Pagani, M, Morrison, B, Zhang, Y, Casas-Bedoya, A, Aalto, T, Harjanne, M, Kapulainen, M, Eggleton, BJ & Marpaung, D 2015, Instantaneous frequency measurement system using four-wave mixing in an ultra-compact long silicon waveguide. in 2015 European Conference on Optical Communication (ECOC)., 7341976, Institute of Electrical and Electronic Engineers IEEE, 41st European Conference on Optical Communication, ECOC 2015, Valencia, Spain, 27/09/15. https://doi.org/10.1109/ECOC.2015.7341976

Instantaneous frequency measurement system using four-wave mixing in an ultra-compact long silicon waveguide. / Pagani, Mattia; Morrison, Blair; Zhang, Yanbing; Casas-Bedoya, Alvaro; Aalto, Timo; Harjanne, Mikko; Kapulainen, Markku; Eggleton, Benjamin J.; Marpaung, David.

2015 European Conference on Optical Communication (ECOC). Institute of Electrical and Electronic Engineers IEEE, 2015. 7341976.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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AU - Morrison, Blair

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AU - Harjanne, Mikko

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Pagani M, Morrison B, Zhang Y, Casas-Bedoya A, Aalto T, Harjanne M et al. Instantaneous frequency measurement system using four-wave mixing in an ultra-compact long silicon waveguide. In 2015 European Conference on Optical Communication (ECOC). Institute of Electrical and Electronic Engineers IEEE. 2015. 7341976 https://doi.org/10.1109/ECOC.2015.7341976