Integrated machine vision technology for line-scan applications

Risto Mitikka, Markku Pietikäinen, Jouko Vilmi, Heikki Ailisto

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)

Abstract

There is clear need for integrated and affordable machine vision systems in line-scan applications, e.g. for width measurement and defect detection. These applications require sensor-like solutions in a price range not achievable with traditional machine vision systems consisting of a line-scan camera, host computer, frame grabber and possibly one or more dedicated processing boards. Since an integrated solution would make a separate host computer and associated boards unnecessary, we set out to study the feasibility of integrated machine vision technology for such applications. Analyses of several potential applications were used to define the requirements for an integrated line-scan camera-based vision system. In order to demonstrate the feasibility of the concept, a research prototype was designed based on these requirements. This is a complete machine vision system with camera front end, fast hardware for corrections, the necessary logic and a computer for higher-level data analysis and I/O. A 4096-pixel CCD array followed by 20 MHz 10 A/D conversion forms the front end. Illumination correction, geometric correction, 7×7 convolution, multilevel pixelwise thresholding and histogramming are all implemented with fast Erasable Programmable Logic Device (EPLD) circuits. A compact PC/104 with a 486 processor takes care of the high-level processing and control. Communication facilities include 12 TTL-level I/O lines, a serial line and a video output.

Original languageEnglish
Title of host publicationMachine Vision Applications, Architectures, and Systems Integration VI
PublisherInternational Society for Optics and Photonics SPIE
Pages108-116
Number of pages9
DOIs
Publication statusPublished - 1 Dec 1997
MoE publication typeA4 Article in a conference publication
EventMachine Vision Applications, Architectures, and Systems Integration VI - Pittsburgh, PA, United States
Duration: 15 Oct 199715 Oct 1997

Publication series

SeriesProceedings of SPIE
Number3205
ISSN0277-786X

Conference

ConferenceMachine Vision Applications, Architectures, and Systems Integration VI
CountryUnited States
CityPittsburgh, PA
Period15/10/9715/10/97

Fingerprint

Machine Vision
computer vision
Computer vision
Vision System
Line
Cameras
cameras
Camera
programmable logic devices
Transistor transistor logic circuits
requirements
Logic devices
Logic
Processing
Convolution
Defect Detection
Charge coupled devices
convolution integrals
Printed circuit boards
logic

Keywords

  • Intelligent camera
  • Sensor-like machine vision
  • Smart camera

Cite this

Mitikka, R., Pietikäinen, M., Vilmi, J., & Ailisto, H. (1997). Integrated machine vision technology for line-scan applications. In Machine Vision Applications, Architectures, and Systems Integration VI (pp. 108-116). International Society for Optics and Photonics SPIE. Proceedings of SPIE, No. 3205 https://doi.org/10.1117/12.285565
Mitikka, Risto ; Pietikäinen, Markku ; Vilmi, Jouko ; Ailisto, Heikki. / Integrated machine vision technology for line-scan applications. Machine Vision Applications, Architectures, and Systems Integration VI. International Society for Optics and Photonics SPIE, 1997. pp. 108-116 (Proceedings of SPIE; No. 3205).
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Mitikka, R, Pietikäinen, M, Vilmi, J & Ailisto, H 1997, Integrated machine vision technology for line-scan applications. in Machine Vision Applications, Architectures, and Systems Integration VI. International Society for Optics and Photonics SPIE, Proceedings of SPIE, no. 3205, pp. 108-116, Machine Vision Applications, Architectures, and Systems Integration VI, Pittsburgh, PA, United States, 15/10/97. https://doi.org/10.1117/12.285565

Integrated machine vision technology for line-scan applications. / Mitikka, Risto; Pietikäinen, Markku; Vilmi, Jouko; Ailisto, Heikki.

Machine Vision Applications, Architectures, and Systems Integration VI. International Society for Optics and Photonics SPIE, 1997. p. 108-116 (Proceedings of SPIE; No. 3205).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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Mitikka R, Pietikäinen M, Vilmi J, Ailisto H. Integrated machine vision technology for line-scan applications. In Machine Vision Applications, Architectures, and Systems Integration VI. International Society for Optics and Photonics SPIE. 1997. p. 108-116. (Proceedings of SPIE; No. 3205). https://doi.org/10.1117/12.285565