In this work, we present the results of integrated Ge detectors grown on a Si photonic platform for sensing applications. The detectors are fabricated on a passive photonic circuit for maximum coupling efficiency. Measurement results at 1300 nm wavelength show a responsivity of 0.2 A/W and very low dark current levels. For a voltage range between 0 and −10 V, the dark current is better than 0.1 nA which is crucial for highly sensitivity devices and applications, like Optical Coherence Tomography.
- Si photonics
- SiGe detectors
- optical coherence tomography
Pandraud, G., Milosavljevic, S., Sammak, A., Cherchi, M., Jovic, A., & Sarro, P. (2017). Integrated SiGe Detectors for Si Photonic Sensor Platforms. Proceedings, 1(4). https://doi.org/10.3390/proceedings1040559