Integrating and testing a system-wide feature in a legacy system: An experience report

Teemu Kanstren, Mika Hongisto, Kari Kolehmainen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)

Abstract

This paper describes our experiences with integrating and testing an embedded, system-wide feature called Dynamic Voltage and Frequency Scaling (DVFS) in a software platform for mobile devices. DVFS affects the whole system by scaling the hardware performance levels during run-time. Implementing and testing the basic functionality of DVFS was easy, however verifying that the whole system worked after integration was more difficult. The platform was legacy code which had not been developed with any consideration for this kind of a feature. We had to consider the complex run-time behaviour of the whole platform, including operating system services, device drivers and applications. DVFS could cause problems and failures in almost any part of the system. Based on our experiences, we describe problems in integrating and testing a system-wide feature like DVFS and suggest possible directions for future research to help address some of these problems.
Original languageEnglish
Title of host publicationProceedings
Subtitle of host publication11th European Conference on Software Maintenance and Reengineering, CSMR 2007
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages203-212
ISBN (Print)0-7695-2802-3
DOIs
Publication statusPublished - 2007
MoE publication typeNot Eligible
Event11th European Conference on Software Maintenance and Reengineering, CSMR 2007 - Amsterdam, Netherlands
Duration: 21 Mar 200723 Mar 2007

Conference

Conference11th European Conference on Software Maintenance and Reengineering, CSMR 2007
Abbreviated titleCSMR 2007
CountryNetherlands
CityAmsterdam
Period21/03/0723/03/07

Fingerprint

Legacy systems
Testing
Computer operating systems
Embedded systems
Mobile devices
Dynamic frequency scaling
Voltage scaling
Hardware

Keywords

  • testing
  • integrating
  • system-wide
  • legacy system

Cite this

Kanstren, T., Hongisto, M., & Kolehmainen, K. (2007). Integrating and testing a system-wide feature in a legacy system: An experience report. In Proceedings: 11th European Conference on Software Maintenance and Reengineering, CSMR 2007 (pp. 203-212). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/CSMR.2007.29
Kanstren, Teemu ; Hongisto, Mika ; Kolehmainen, Kari. / Integrating and testing a system-wide feature in a legacy system : An experience report. Proceedings: 11th European Conference on Software Maintenance and Reengineering, CSMR 2007. IEEE Institute of Electrical and Electronic Engineers , 2007. pp. 203-212
@inproceedings{6064c96a25ce47f0a677be248f04583e,
title = "Integrating and testing a system-wide feature in a legacy system: An experience report",
abstract = "This paper describes our experiences with integrating and testing an embedded, system-wide feature called Dynamic Voltage and Frequency Scaling (DVFS) in a software platform for mobile devices. DVFS affects the whole system by scaling the hardware performance levels during run-time. Implementing and testing the basic functionality of DVFS was easy, however verifying that the whole system worked after integration was more difficult. The platform was legacy code which had not been developed with any consideration for this kind of a feature. We had to consider the complex run-time behaviour of the whole platform, including operating system services, device drivers and applications. DVFS could cause problems and failures in almost any part of the system. Based on our experiences, we describe problems in integrating and testing a system-wide feature like DVFS and suggest possible directions for future research to help address some of these problems.",
keywords = "testing, integrating, system-wide, legacy system",
author = "Teemu Kanstren and Mika Hongisto and Kari Kolehmainen",
note = "Project code: 4455",
year = "2007",
doi = "10.1109/CSMR.2007.29",
language = "English",
isbn = "0-7695-2802-3",
pages = "203--212",
booktitle = "Proceedings",
publisher = "IEEE Institute of Electrical and Electronic Engineers",
address = "United States",

}

Kanstren, T, Hongisto, M & Kolehmainen, K 2007, Integrating and testing a system-wide feature in a legacy system: An experience report. in Proceedings: 11th European Conference on Software Maintenance and Reengineering, CSMR 2007. IEEE Institute of Electrical and Electronic Engineers , pp. 203-212, 11th European Conference on Software Maintenance and Reengineering, CSMR 2007, Amsterdam, Netherlands, 21/03/07. https://doi.org/10.1109/CSMR.2007.29

Integrating and testing a system-wide feature in a legacy system : An experience report. / Kanstren, Teemu; Hongisto, Mika; Kolehmainen, Kari.

Proceedings: 11th European Conference on Software Maintenance and Reengineering, CSMR 2007. IEEE Institute of Electrical and Electronic Engineers , 2007. p. 203-212.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

TY - GEN

T1 - Integrating and testing a system-wide feature in a legacy system

T2 - An experience report

AU - Kanstren, Teemu

AU - Hongisto, Mika

AU - Kolehmainen, Kari

N1 - Project code: 4455

PY - 2007

Y1 - 2007

N2 - This paper describes our experiences with integrating and testing an embedded, system-wide feature called Dynamic Voltage and Frequency Scaling (DVFS) in a software platform for mobile devices. DVFS affects the whole system by scaling the hardware performance levels during run-time. Implementing and testing the basic functionality of DVFS was easy, however verifying that the whole system worked after integration was more difficult. The platform was legacy code which had not been developed with any consideration for this kind of a feature. We had to consider the complex run-time behaviour of the whole platform, including operating system services, device drivers and applications. DVFS could cause problems and failures in almost any part of the system. Based on our experiences, we describe problems in integrating and testing a system-wide feature like DVFS and suggest possible directions for future research to help address some of these problems.

AB - This paper describes our experiences with integrating and testing an embedded, system-wide feature called Dynamic Voltage and Frequency Scaling (DVFS) in a software platform for mobile devices. DVFS affects the whole system by scaling the hardware performance levels during run-time. Implementing and testing the basic functionality of DVFS was easy, however verifying that the whole system worked after integration was more difficult. The platform was legacy code which had not been developed with any consideration for this kind of a feature. We had to consider the complex run-time behaviour of the whole platform, including operating system services, device drivers and applications. DVFS could cause problems and failures in almost any part of the system. Based on our experiences, we describe problems in integrating and testing a system-wide feature like DVFS and suggest possible directions for future research to help address some of these problems.

KW - testing

KW - integrating

KW - system-wide

KW - legacy system

U2 - 10.1109/CSMR.2007.29

DO - 10.1109/CSMR.2007.29

M3 - Conference article in proceedings

SN - 0-7695-2802-3

SP - 203

EP - 212

BT - Proceedings

PB - IEEE Institute of Electrical and Electronic Engineers

ER -

Kanstren T, Hongisto M, Kolehmainen K. Integrating and testing a system-wide feature in a legacy system: An experience report. In Proceedings: 11th European Conference on Software Maintenance and Reengineering, CSMR 2007. IEEE Institute of Electrical and Electronic Engineers . 2007. p. 203-212 https://doi.org/10.1109/CSMR.2007.29