Abstract
This paper describes our experiences with integrating and testing an
embedded, system-wide feature called Dynamic Voltage and Frequency Scaling
(DVFS) in a software platform for mobile devices. DVFS affects the whole
system by scaling the hardware performance levels during run-time.
Implementing and testing the basic functionality of DVFS was easy, however
verifying that the whole system worked after integration was more difficult.
The platform was legacy code which had not been developed with any
consideration for this kind of a feature. We had to consider the complex
run-time behaviour of the whole platform, including operating system services,
device drivers and applications. DVFS could cause problems and failures in
almost any part of the system. Based on our experiences, we describe problems
in integrating and testing a system-wide feature like DVFS and suggest
possible directions for future research to help address some of these
problems.
| Original language | English |
|---|---|
| Title of host publication | Proceedings |
| Subtitle of host publication | 11th European Conference on Software Maintenance and Reengineering, CSMR 2007 |
| Publisher | IEEE Institute of Electrical and Electronic Engineers |
| Pages | 203-212 |
| ISBN (Print) | 0-7695-2802-3 |
| DOIs | |
| Publication status | Published - 2007 |
| MoE publication type | Not Eligible |
| Event | 11th European Conference on Software Maintenance and Reengineering, CSMR 2007 - Amsterdam, Netherlands Duration: 21 Mar 2007 → 23 Mar 2007 |
Conference
| Conference | 11th European Conference on Software Maintenance and Reengineering, CSMR 2007 |
|---|---|
| Abbreviated title | CSMR 2007 |
| Country/Territory | Netherlands |
| City | Amsterdam |
| Period | 21/03/07 → 23/03/07 |
Keywords
- testing
- integrating
- system-wide
- legacy system