Integration of root cause analysis into a model-based testing process of a mobile switching server

Mikko Nieminen, Tomi Räty, R. Teittinen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Abstract

Model-based testing of software has proved effective for automation of testing and efficient error discovery, by utilizing modeled behavior of the system under test and automated test case generation. One of the important challenges in model-based testing is locating the fundamental sources of encountered errors. A root cause analysis solution should be able to find the causes of errors among different components in a model-based testing process, while automating the analysis to eliminate daunting data-intensive manual work. We present a design for a Root Cause Analyzer (RCA) component, aimed at automated test analysis utilizing the outputs generated in a model-based testing process, and producing human and machine readable analysis reports. A prototype RCA implementation is integrated into a tool chain used for offline functional testing of a Mobile Switching Server (MSS) in cellular networks. The RCA prototype is shown to discover causes of errors encountered during testing and pinpointing them in several components of the testing environment. The RCA design also demonstrates potential for integration into other model-based testing processes.
Original languageEnglish
Title of host publicationProceedings
Subtitle of host publication10th International Conference on Information Technology: New Generations, ITNG 2013
PublisherInstitute of Electrical and Electronic Engineers IEEE
Pages305-309
ISBN (Electronic)978-0-7695-4967-5
DOIs
Publication statusPublished - 2013
MoE publication typeNot Eligible
Event10th International Conference on Information Technology: New Generations, ITNG 2013 - Las Vegas, NV, United States
Duration: 15 Apr 201317 Apr 2013

Conference

Conference10th International Conference on Information Technology: New Generations, ITNG 2013
Abbreviated titleITNG 2013
CountryUnited States
CityLas Vegas, NV
Period15/04/1317/04/13

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Servers
Testing
Automation

Keywords

  • model-based monitoring
  • model-based testing
  • root-cause analysis
  • elecommunications
  • test analysis

Cite this

Nieminen, M., Räty, T., & Teittinen, R. (2013). Integration of root cause analysis into a model-based testing process of a mobile switching server. In Proceedings: 10th International Conference on Information Technology: New Generations, ITNG 2013 (pp. 305-309). Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/ITNG.2013.49
Nieminen, Mikko ; Räty, Tomi ; Teittinen, R. / Integration of root cause analysis into a model-based testing process of a mobile switching server. Proceedings: 10th International Conference on Information Technology: New Generations, ITNG 2013. Institute of Electrical and Electronic Engineers IEEE, 2013. pp. 305-309
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Nieminen, M, Räty, T & Teittinen, R 2013, Integration of root cause analysis into a model-based testing process of a mobile switching server. in Proceedings: 10th International Conference on Information Technology: New Generations, ITNG 2013. Institute of Electrical and Electronic Engineers IEEE, pp. 305-309, 10th International Conference on Information Technology: New Generations, ITNG 2013, Las Vegas, NV, United States, 15/04/13. https://doi.org/10.1109/ITNG.2013.49

Integration of root cause analysis into a model-based testing process of a mobile switching server. / Nieminen, Mikko; Räty, Tomi; Teittinen, R.

Proceedings: 10th International Conference on Information Technology: New Generations, ITNG 2013. Institute of Electrical and Electronic Engineers IEEE, 2013. p. 305-309.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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Nieminen M, Räty T, Teittinen R. Integration of root cause analysis into a model-based testing process of a mobile switching server. In Proceedings: 10th International Conference on Information Technology: New Generations, ITNG 2013. Institute of Electrical and Electronic Engineers IEEE. 2013. p. 305-309 https://doi.org/10.1109/ITNG.2013.49