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Intercomparison of copper fixed-point cells by using Pt/Pd thermocouples
F. Edler (Corresponding Author), M. Anagnostou, J. Bojkovski, S. Gaita, C. Garcia, E. Grudniewicz, F. Helgesen, J. Ivarsson, A. Pauza, P. Rosenkranz, M. Smid, T. Weckström, D. Zvizdic
- German National Metrology Institute
- Hellenic Institute of Metrology (EIM)
- National Institute of Metrology (INM)
- Centro Español de Metrología (CEM)
- Central Office of Measures (GUM)
- Norwegian Metrology Service
- RISE Research Institutes of Sweden
- Vilnius Metrology Centre Semiconductor Physics Institute (VMC/PFI)
- Bundesamt für Eich- und Vermessungswesen (BEV)
- Czech Metrology Institute (CMI)
- University of Zagreb
- University of Ljubljana
- Centre for Metrology and Accreditation Finland (MIKES)
Research output: Contribution to journal › Article › Scientific › peer-review
5
Citations
(Scopus)