Keyphrases
Low Temperature Co-fired Ceramic
100%
Interfacial Reaction
100%
Metallization
100%
Thick Film
100%
Ag-Pt
100%
Sn-based Solder
100%
Printed Circuit Board
40%
Soldering
40%
Board Assembly
40%
Failure Mechanism
20%
Lead-free Solder
20%
Test Assembly
20%
Metallurgical Reaction
20%
Microstructure
10%
Highest Peak
10%
Design Methodology
10%
Porosity
10%
SEM Observation
10%
Temperature Range
10%
Adverse Effects
10%
Practical Guidelines
10%
SEM-EDS
10%
Resistance Measurement
10%
DC Resistance
10%
Metallized Layer
10%
Scanning Acoustic Microscopy
10%
Peak Temperature
10%
Reflow
10%
Reflow Soldering
10%
Intermetallic Compound Layer
10%
Temperature Cycling Test
10%
Metallurgical Effect
10%
Solder Joint Reliability
10%
Intermetallic Compound Formation
10%
Board Level Reliability
10%
Reflow Temperature
10%
Ag-based
10%
Common Lead
10%
Solder Interconnect
10%
Solder Material
10%
Sn-Ag-Cu
10%
Reflow Cycles
10%
Ceramic Metallization
10%
INIS
low temperature
100%
ceramics
100%
films
100%
reliability
30%
failures
20%
layers
20%
levels
20%
scanning electron microscopy
20%
peaks
20%
investigations
20%
intermetallic compounds
20%
values
10%
interactions
10%
interfaces
10%
design
10%
microstructure
10%
increasing
10%
liquids
10%
guidelines
10%
porosity
10%
lifetime
10%
temperature range
10%
scanning acoustic microscopy
10%
soldering
10%
metallurgical effects
10%
Engineering
Low-Temperature
100%
Metallizations
100%
Printed Circuit Board
40%
Joints (Structural Components)
20%
Failure Mechanism
20%
Intermetallics
20%
Temperature Range
10%
Practical Guideline
10%
Peak Temperature
10%
Compound Layer
10%
Scanning Acoustic Microscopy
10%
Compound Formation
10%
Porosity
10%
Energy dispersive spectrometry
10%
Material Science
Low Temperature Co-Fired Ceramics
100%
Thick Films
100%
Scanning Electron Microscopy
20%
Intermetallics
20%
Scanning Acoustic Microscopy
10%
Solder Joint
10%
Energy-Dispersive X-Ray Spectroscopy
10%