Interferometric length measurements

Erkki Ikonen, Antti Lassila, J. Luukkainen, K. Riski

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

3 Citations (Scopus)

Abstract

Automated interferometer equipments are described which can be used for calibration of gauge blocks and line scales with lengths up to 1000 mm. For the gauge blocks, the scanning measurement method utilizes a white-light source and one stabilized 633-nm laser. White-light interference signals from the reference flat and from the front surface of the gauge block mark the distance to be measured with the laser. The final length is determined from the laser-signal phase shifts between the gauge and the reference flat. Environmental conditions are measured and the necessary corrections are made automatically. The repeatability of the measurements is ± 3 nm for a 400-mm gauge block and the estimated relative uncertainty (1s) is about 10-7. The variation in length of the gauge block is obtained by computer-aided analysis of the digitized interference fringe patterns. For the line scales, a new measurement method has been developed which can utilize the same electronic units as used for gauge-block calibration: Images of the graduation lines replace the white-light interferences. The two fields constituting a video frame (image) are recorded by a moving microscope and by a ccd camera with 1-ms charging time interval. The exact distance between the microscope positions at the time of charging the ccd pixels is deduced from the interference and video synchronization signals. It is expected that a total uncertainty of about 100 nm for a 1000-mm scale will be reached.

Original languageEnglish
Title of host publicationInterferometry
Subtitle of host publicationApplications
EditorsRyszard J. Pryputniewicz, Gordon M. Brown, Werner P.O. Jueptner
PublisherInternational Society for Optics and Photonics SPIE
Pages86-97
DOIs
Publication statusPublished - 15 Feb 1993
MoE publication typeA4 Article in a conference publication
EventSan Diego '92: Interferometry: Applications 1992 - San Diego, United States
Duration: 22 Jul 199222 Jul 1992

Publication series

SeriesProceedings of SPIE
Volume1756
ISSN0277-786X

Conference

ConferenceSan Diego '92
CountryUnited States
CitySan Diego
Period22/07/9222/07/92

Fingerprint Dive into the research topics of 'Interferometric length measurements'. Together they form a unique fingerprint.

  • Cite this

    Ikonen, E., Lassila, A., Luukkainen, J., & Riski, K. (1993). Interferometric length measurements. In R. J. Pryputniewicz, G. M. Brown, & W. P. O. Jueptner (Eds.), Interferometry: Applications (pp. 86-97). International Society for Optics and Photonics SPIE. Proceedings of SPIE, Vol.. 1756 https://doi.org/10.1117/12.140790