Abstract
Original language | English |
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Pages (from-to) | 329-339 |
Number of pages | 11 |
Journal | Metrologia |
Volume | 37 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2000 |
MoE publication type | A1 Journal article-refereed |
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International comparison of eight semiconductor lasers stabilized on 127I2 at λ = 633 nm. / Zarka, A.; Abou-Zeid, A.; Chagniot, D.; Chartier, J-M.; Cip, O.; Cliche, J.; Edwards, C.S.; Imkenberg, F.; Jedlicka, P.; Kabel, B.; Lassila, Antti; Lazar, J.; Merimaa, M.; Millerioux, Y.; Simonsen, H.; Têtu, M.; Wallerand, J-P.
In: Metrologia, Vol. 37, No. 4, 2000, p. 329-339.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - International comparison of eight semiconductor lasers stabilized on 127I2 at λ = 633 nm
AU - Zarka, A.
AU - Abou-Zeid, A.
AU - Chagniot, D.
AU - Chartier, J-M.
AU - Cip, O.
AU - Cliche, J.
AU - Edwards, C.S.
AU - Imkenberg, F.
AU - Jedlicka, P.
AU - Kabel, B.
AU - Lassila, Antti
AU - Lazar, J.
AU - Merimaa, M.
AU - Millerioux, Y.
AU - Simonsen, H.
AU - Têtu, M.
AU - Wallerand, J-P.
PY - 2000
Y1 - 2000
N2 - An international comparison of eight 127I2-stabilized semiconductor laser systems (DLs) has been carried out. Five of the DLs were extended-cavity lasers (ECLs) using extra-cavity saturation spectroscopy; another was a microlens-mounted diode modified to have weak optical feedback, stabilized using the same technique; the seventh ECL was stabilized using frequency-modulated spectroscopy. The final DL was a simple laser diode at 635 nm locked with a digital system on a linear absorption of iodine. The P(33) 6-3 transition of iodine was first used to compare the first seven DLs with a He-Ne laser stabilized on the R(127) 11-5 transition of iodine. The relative frequency stability of these lasers was between 5 parts in 1011 and 7 parts in 1012 for a sampling time of 1 s, with the best results less than 2 parts in 1013 over 1000 s. The frequency repeatability measured during one week was of the order of a few tens of kilohertz. This large fluctuation was caused by poor adjustment of the electronic offset of two of the lasers. For the well-corrected lasers, the repeatability was within a few kilohertz. A study of stabilization on the strong absorption group of transitions R(60) 8-4, R(125) 9-4 and P(54) 8-4, located about -12 GHz from the R(127) 11-5 transition, was also carried out. For the first time, a short-term frequency stability better than that of the classical He-Ne laser around 633 nm has been achieved with a relative frequency stability of 4 parts in 1012 for 1 s.
AB - An international comparison of eight 127I2-stabilized semiconductor laser systems (DLs) has been carried out. Five of the DLs were extended-cavity lasers (ECLs) using extra-cavity saturation spectroscopy; another was a microlens-mounted diode modified to have weak optical feedback, stabilized using the same technique; the seventh ECL was stabilized using frequency-modulated spectroscopy. The final DL was a simple laser diode at 635 nm locked with a digital system on a linear absorption of iodine. The P(33) 6-3 transition of iodine was first used to compare the first seven DLs with a He-Ne laser stabilized on the R(127) 11-5 transition of iodine. The relative frequency stability of these lasers was between 5 parts in 1011 and 7 parts in 1012 for a sampling time of 1 s, with the best results less than 2 parts in 1013 over 1000 s. The frequency repeatability measured during one week was of the order of a few tens of kilohertz. This large fluctuation was caused by poor adjustment of the electronic offset of two of the lasers. For the well-corrected lasers, the repeatability was within a few kilohertz. A study of stabilization on the strong absorption group of transitions R(60) 8-4, R(125) 9-4 and P(54) 8-4, located about -12 GHz from the R(127) 11-5 transition, was also carried out. For the first time, a short-term frequency stability better than that of the classical He-Ne laser around 633 nm has been achieved with a relative frequency stability of 4 parts in 1012 for 1 s.
U2 - 10.1088/0026-1394/37/4/11
DO - 10.1088/0026-1394/37/4/11
M3 - Article
VL - 37
SP - 329
EP - 339
JO - Metrologia
JF - Metrologia
SN - 0026-1394
IS - 4
ER -