International comparison of eight semiconductor lasers stabilized on 127I2 at λ = 633 nm
- A. Zarka
- , A. Abou-Zeid
- , D. Chagniot
- , J-M. Chartier
- , O. Cip
- , J. Cliche
- , C.S. Edwards
- , F. Imkenberg
- , P. Jedlicka
- , B. Kabel
- , Antti Lassila
- , J. Lazar
- , Mikko Merimaa
- , Y. Millerioux
- , H. Simonsen
- , M. Têtu
- , J-P. Wallerand
- Bureau International des Poids et Mesures (BIPM)
- German National Metrology Institute (PTB)
- Bureau National de Métrologie (BNM)
- Czech Academy of Sciences
- Université Laval
- National Physics Laboratory (NPL)
- Centre for Metrology and Accreditation Finland (MIKES)
- Helsinki University of Technology
- Technical University of Denmark (DTU)
Research output: Contribution to journal › Article › Scientific › peer-review
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