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International comparison of eight semiconductor lasers stabilized on 127I2 at λ = 633 nm
A. Zarka, A. Abou-Zeid, D. Chagniot, J-M. Chartier, O. Cip, J. Cliche, C.S. Edwards, F. Imkenberg, P. Jedlicka, B. Kabel, Antti Lassila, J. Lazar, Mikko Merimaa, Y. Millerioux, H. Simonsen, M. Têtu, J-P. Wallerand
- Bureau International des Poids et Mesures (BIPM)
- German National Metrology Institute (PTB)
- Bureau National de Métrologie (BNM)
- Czech Academy of Sciences
- Université Laval
- National Physics Laboratory (NPL)
- Centre for Metrology and Accreditation Finland (MIKES)
- Helsinki University of Technology
- Technical University of Denmark (DTU)
Research output: Contribution to journal › Article › Scientific › peer-review
23
Citations
(Scopus)