Inverted method for fabricating a nano-aperture device with subwavelength structures

A. Suutala, Juuso Olkkonen, D.C. Cox, J. Lappalainen, H. Jantunen

    Research output: Contribution to journalArticlepeer-review

    3 Citations (Scopus)

    Abstract

    An inverted method for fabricating a plasmonic nanoaperture device by using focused ion beam (FIB) milling and focused electron beam _FEB_ induced deposition is proposed here. The device structure presented consists of a periodic annulus grating pattern along the interface of a quartz substrate and
    sputtered aluminum layers and a cylindrical high-index filled nanoaperture through the aluminum film in the center of the grating. FIB milling was used to process the annulus pattern on the quartz substrate. A dielectric nanopost _or inverted nanoaperture_ was fabricated by FEB-induced deposition using tetraethyl orthosilicate as a precursor. The device geometry was characterized by atomic force microscopy and scanning electron microscopy. The structural processability of the device was proven with adequate accuracy and the properties of the materials also met the conditions of the device model in terms of functionality.
    Original languageEnglish
    Pages (from-to)2457-2461
    Number of pages5
    JournalJournal of Vacuum Science and Technology B: Nanotechnology and Microelectronics
    Volume27
    Issue number6
    DOIs
    Publication statusPublished - 2009
    MoE publication typeA1 Journal article-refereed

    Keywords

    • nanoaperture devices
    • subwavelengths
    • focused ion beam (FIB)
    • focused electron beam (FEB)

    Fingerprint

    Dive into the research topics of 'Inverted method for fabricating a nano-aperture device with subwavelength structures'. Together they form a unique fingerprint.

    Cite this